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O'Keefe, Michael A., Shao-Horn, Yang (2003) Seeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy. Microscopy and Microanalysis, 9. 268-269 doi:10.1017/s1431927603441342

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Reference TypeJournal (article/letter/editorial)
TitleSeeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy
JournalMicroscopy and Microanalysis
AuthorsO'Keefe, Michael A.Author
Shao-Horn, YangAuthor
Year2003 (August)Volume9
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927603441342Search in ResearchGate
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Mindat Ref. ID4820172Long-form Identifiermindat:1:5:4820172:0
GUID0
Full ReferenceO'Keefe, Michael A., Shao-Horn, Yang (2003) Seeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy. Microscopy and Microanalysis, 9. 268-269 doi:10.1017/s1431927603441342
Plain TextO'Keefe, Michael A., Shao-Horn, Yang (2003) Seeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy. Microscopy and Microanalysis, 9. 268-269 doi:10.1017/s1431927603441342
In(2003) Microscopy and Microanalysis Vol. 9. Cambridge University Press (CUP)

See Also

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O'Keefe, Michael A., Shao-Horn, Yang (2004) Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms. Microscopy and Microanalysis, 10 (1). 86-95 doi:10.1017/s143192760404019x
O'Keefe, Michael A. (2004) Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM. Microscopy and Microanalysis, 10. 972-973 doi:10.1017/s1431927604881868
O'Keefe, Michael A. (2004) Sub-Ångstrom Resolution with Aberration-Corrected TEM: Present and Future. Microscopy and Microanalysis, 10. 68-69 doi:10.1017/s1431927604555873
O'Keefe, Michael A., Allard, Lawrence F. (2004) A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes. Microscopy and Microanalysis, 10. 1002-1003 doi:10.1017/s1431927604880681
Allard, Lawrence F., O'Keefe, Michael A. (2004) Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens. Microscopy and Microanalysis, 10. 66-67 doi:10.1017/s1431927604555861
Michael A. O’Keefe, (2003) HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM. Microscopy and Microanalysis, 9. 936-937 doi:10.1017/s1431927603444681
O'Keefe, Michael A., Hetherington, Crispin J.D., Chris Nelson, E. (2004) Sub-Ångstrom Resolution with a Mid-Voltage TEM. Microscopy Today, 12 (3). 28-29 doi:10.1017/s1551929500052123
O'Keefe, M A, Allard, L F, Blom, D A (2005) Resolution Quality and Atom Positions in Sub-Ångström Electron Microscopy. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605509966
Smith, David J. (2003) High Resolution Electron Microscopy - Principles and Practice. Microscopy and Microanalysis, 9. 1560-1561 doi:10.1017/s1431927603447806
O'Keefe, Michael A. (2004) Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope. Microscopy and Microanalysis, 10 (4). 397-399 doi:10.1017/s1431927604211059
Carmichael, Stephen W. (2003) Sub-Ångstrom Resolution. Microscopy Today, 11 (6). 3-7 doi:10.1017/s1551929500053372
 
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