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O'Keefe, Michael A., Allard, Lawrence F. (2004) A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes. Microscopy and Microanalysis, 10. 1002-1003 doi:10.1017/s1431927604880681

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Reference TypeJournal (article/letter/editorial)
TitleA Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes
JournalMicroscopy and Microanalysis
AuthorsO'Keefe, Michael A.Author
Allard, Lawrence F.Author
Year2004 (August)Volume10
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927604880681Search in ResearchGate
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Mindat Ref. ID4823786Long-form Identifiermindat:1:5:4823786:8
GUID0
Full ReferenceO'Keefe, Michael A., Allard, Lawrence F. (2004) A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes. Microscopy and Microanalysis, 10. 1002-1003 doi:10.1017/s1431927604880681
Plain TextO'Keefe, Michael A., Allard, Lawrence F. (2004) A Standard for Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes. Microscopy and Microanalysis, 10. 1002-1003 doi:10.1017/s1431927604880681
In(2004) Microscopy and Microanalysis Vol. 10. Cambridge University Press (CUP)

See Also

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Allard, Lawrence F., O'Keefe, Michael A. (2004) Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens. Microscopy and Microanalysis, 10. 66-67 doi:10.1017/s1431927604555861
O'Keefe, Michael A. (2004) Sub-Ångstrom Resolution with Aberration-Corrected TEM: Present and Future. Microscopy and Microanalysis, 10. 68-69 doi:10.1017/s1431927604555873
O'Keefe, Michael A. (2004) Seeing Atoms at Sub-Ångstrom Resolution with Aberration-Corrected TEM. Microscopy and Microanalysis, 10. 972-973 doi:10.1017/s1431927604881868
Liu, Jingyue, Allard, Lawrence F. (2010) Surface Channeling in Aberration-Corrected Scanning Transmission Electron Microscopy of Nanostructures. Microscopy and Microanalysis, 16 (4). 425-433 doi:10.1017/s1431927610000450
O'Keefe, Michael A., Shao-Horn, Yang (2003) Seeing Lithium Atoms by Sub-Ångstrom High-Resolution Electron Microscopy. Microscopy and Microanalysis, 9. 268-269 doi:10.1017/s1431927603441342
Allard, Lawrence F, Blom, Douglas A, O'Keefe, Michael A, Kiely, Chris J, Ackland, D., Watanabe, M., Kawasaki, M., Kaneyama, T., Sawada, H. (2004) First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM. Microscopy and Microanalysis, 10. 110-111 doi:10.1017/s1431927604882990
O'Keefe, Michael A., Shao-Horn, Yang (2004) Sub-Ångstrom Atomic-Resolution Imaging from Heavy Atoms to Light Atoms. Microscopy and Microanalysis, 10 (1). 86-95 doi:10.1017/s143192760404019x
Batson, Philip, Muller, David, Allard, Lawrence, Voyles, Paul, Chi, Miofang, O'Keefe, Michael (2011) Pre-Meeting Congress on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data. Microscopy and Microanalysis, 17. 20 doi:10.1017/s1431927611000729
Blom, Douglas A., Allard, Lawrence F., Mishina, Satoshi, O'Keefe, Michael A. (2006) Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory. Microscopy and Microanalysis, 12 (6). 483-491 doi:10.1017/s1431927606060570
O'Keefe, MA, Allard, LF, Nelson, EC, Blom, DA (2006) Accurate Objective Lens Defocus Calibration for Focal-Series Aberration-Corrected HRTEM at Sub-Ångström Resolution. Microscopy and Microanalysis, 12. 1472-1473 doi:10.1017/s1431927606069716
Bell, David C., Russo, Christopher J., Benner, Gerd (2010) Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope. Microscopy and Microanalysis, 16 (4). 386-392 doi:10.1017/s1431927610093670
 
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