Rouvière, J, Okuno, H, Jouneau, P, Bayle-Guillemaud, P, Daudin, B (2011) Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy. Microscopy and Microanalysis, 17. 1284-1285 doi:10.1017/s143192761100729x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy | ||
Journal | Microscopy and Microanalysis | ||
Authors | Rouvière, J | Author | |
Okuno, H | Author | ||
Jouneau, P | Author | ||
Bayle-Guillemaud, P | Author | ||
Daudin, B | Author | ||
Year | 2011 (July) | Volume | 17 |
Publisher | Cambridge University Press (CUP) | ||
DOI | doi:10.1017/s143192761100729xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 4856319 | Long-form Identifier | mindat:1:5:4856319:8 |
GUID | 0 | ||
Full Reference | Rouvière, J, Okuno, H, Jouneau, P, Bayle-Guillemaud, P, Daudin, B (2011) Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy. Microscopy and Microanalysis, 17. 1284-1285 doi:10.1017/s143192761100729x | ||
Plain Text | Rouvière, J, Okuno, H, Jouneau, P, Bayle-Guillemaud, P, Daudin, B (2011) Counting Tm Dopant Atoms in and Around GaN Dots using Scannning Transmission Electron Microscopy. Microscopy and Microanalysis, 17. 1284-1285 doi:10.1017/s143192761100729x | ||
In | (2011) Microscopy and Microanalysis Vol. 17. Cambridge University Press (CUP) |
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