Haberfehlner, G., Bayle-Guillemaud, P., Audoit, G., Smith, M.J., Crawford, S., Gradečak, S., Morel, P.-H., Ernst, T., Gambacorti, N., Bleuet, P. (2013) Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices. Microscopy and Microanalysis, 19. 576-577 doi:10.1017/s143192761300487x
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices | ||
| Journal | Microscopy and Microanalysis | ||
| Authors | Haberfehlner, G. | Author | |
| Bayle-Guillemaud, P. | Author | ||
| Audoit, G. | Author | ||
| Smith, M.J. | Author | ||
| Crawford, S. | Author | ||
| Gradečak, S. | Author | ||
| Morel, P.-H. | Author | ||
| Ernst, T. | Author | ||
| Gambacorti, N. | Author | ||
| Bleuet, P. | Author | ||
| Year | 2013 (August) | Volume | 19 |
| Publisher | Cambridge University Press (CUP) | ||
| DOI | doi:10.1017/s143192761300487xSearch in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4862829 | Long-form Identifier | mindat:1:5:4862829:1 |
| GUID | 0 | ||
| Full Reference | Haberfehlner, G., Bayle-Guillemaud, P., Audoit, G., Smith, M.J., Crawford, S., Gradečak, S., Morel, P.-H., Ernst, T., Gambacorti, N., Bleuet, P. (2013) Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices. Microscopy and Microanalysis, 19. 576-577 doi:10.1017/s143192761300487x | ||
| Plain Text | Haberfehlner, G., Bayle-Guillemaud, P., Audoit, G., Smith, M.J., Crawford, S., Gradečak, S., Morel, P.-H., Ernst, T., Gambacorti, N., Bleuet, P. (2013) Electron Tomography for 3D Nanoscale Characterization of Semiconductor Materials and Devices. Microscopy and Microanalysis, 19. 576-577 doi:10.1017/s143192761300487x | ||
| In | (2013) Microscopy and Microanalysis Vol. 19. Cambridge University Press (CUP) | ||
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