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Borisenko, Konstantin B., Allen, Christopher S., Warner, Jamie H., Kirkland, Angus I. (2015) Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis. Microscopy and Microanalysis, 21. 745-746 doi:10.1017/s1431927615004523

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Reference TypeJournal (article/letter/editorial)
TitleElectron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis
JournalMicroscopy and Microanalysis
AuthorsBorisenko, Konstantin B.Author
Allen, Christopher S.Author
Warner, Jamie H.Author
Kirkland, Angus I.Author
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615004523Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4872017Long-form Identifiermindat:1:5:4872017:3
GUID0
Full ReferenceBorisenko, Konstantin B., Allen, Christopher S., Warner, Jamie H., Kirkland, Angus I. (2015) Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis. Microscopy and Microanalysis, 21. 745-746 doi:10.1017/s1431927615004523
Plain TextBorisenko, Konstantin B., Allen, Christopher S., Warner, Jamie H., Kirkland, Angus I. (2015) Electron Exit Wave Reconstruction From a Single Defocused Image Using a Gaussian Basis. Microscopy and Microanalysis, 21. 745-746 doi:10.1017/s1431927615004523
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

See Also

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Borisenko, Konstantin B, Kirkland, Angus I (2014) High resolution electron exit wave reconstruction from a diffraction pattern using Gaussian basis decomposition. Journal of Physics: Conference Series, 522. 12019pp. doi:10.1088/1742-6596/522/1/012019
Kirkland, Angus, Kim, Judy, Warner, Jamie, Borisenko, Konstantin, Haigh, Sarah, Young, Neil, Wang, Peng, Nellist, Peter (2014) Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science. Microscopy and Microanalysis, 20. 930-931 doi:10.1017/s1431927614006370
Allen, Christopher S., Song, Jiamei, Danaie, Mohsen, Wang, Peng, Kirkland, Angus I. (2018) Low Dose Defocused Probe Electron Ptychography Using a Fast Direct Electron Detector. Microscopy and Microanalysis, 24. 186-187 doi:10.1017/s1431927618001423
Song, Biying, Ding, Zhiyuan, Allen, Christopher, Sawada, Hidetaka, Pan, Xiaoqing, Kirkland, Angus I., Wang, Peng (2019) Electron ptychography using an ultrafast direct electron detector. Microscopy and Microanalysis, 25. 20-21 doi:10.1017/s1431927619000837
Song, Jiamei, Allen, Christopher S., Gao, Si, Huang, Chen, Sawada, Hidetaka, Pan, Xiaoqing, Warner, Jamie, Wang, Peng, Kirkland, Angus I. (2019) Atomic Resolution Defocused Electron Ptychography at Low Dose with a Fast, Direct Electron Detector. Scientific Reports, 9. doi:10.1038/s41598-019-40413-z
Kirkland, AI, Haigh, S (2009) Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data. Microscopy and Microanalysis, 15. 1472-1473 doi:10.1017/s1431927609099619
Moya, Arthur N., Makgae, Ofentse A., Liberti, Emanuela, Kirkland, Angus I. (2019) A Semi-quantitative Predictive Model for SnO2 Adatom Diffusion & Its Application to Exit Wave Reconstruction. Microscopy and Microanalysis, 25. 108-109 doi:10.1017/s1431927619001272
Haigh, Sarah J., Sawada, Hidetaka, Takayanagi, Kunio, Kirkland, Angus I. (2010) Exceeding Conventional Resolution Limits in High-Resolution Transmission Electron Microscopy Using Tilted Illumination and Exit-Wave Restoration. Microscopy and Microanalysis, 16 (4). 409-415 doi:10.1017/s1431927610093359
Sawada, Hidetaka, Allen, Christopher S., Wang, Shanshan, Warner, Jamie H., Kirkland, Angus I. (2017) Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials. Ultramicroscopy, 182. 195-204 doi:10.1016/j.ultramic.2017.06.024
Morgan, A.J., Martin, A.V., D'Alfonso, A.J., Putkunz, C.T., Allen, L.J. (2011) Direct exit-wave reconstruction from a single defocused image. Ultramicroscopy, 111 (9). 1455-1460 doi:10.1016/j.ultramic.2011.07.005
Fang, Shiang, Wen, Yi, Allen, Christopher S., Ophus, Colin, Han, Grace G. D., Kirkland, Angus I., Kaxiras, Efthimios, Warner, Jamie H. (2019) Atomic electrostatic maps of 1D channels in 2D semiconductors using 4D scanning transmission electron microscopy. Nature Communications, 10. doi:10.1038/s41467-019-08904-9
 
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