Sawada, Hidetaka, Allen, Christopher S., Wang, Shanshan, Warner, Jamie H., Kirkland, Angus I. (2017) Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials. Ultramicroscopy, 182. 195-204 doi:10.1016/j.ultramic.2017.06.024
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials | ||
| Journal | Ultramicroscopy | ||
| Authors | Sawada, Hidetaka | Author | |
| Allen, Christopher S. | Author | ||
| Wang, Shanshan | Author | ||
| Warner, Jamie H. | Author | ||
| Kirkland, Angus I. | Author | ||
| Year | 2017 (November) | Volume | 182 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.ultramic.2017.06.024Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 4911183 | Long-form Identifier | mindat:1:5:4911183:1 |
| GUID | 0 | ||
| Full Reference | Sawada, Hidetaka, Allen, Christopher S., Wang, Shanshan, Warner, Jamie H., Kirkland, Angus I. (2017) Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials. Ultramicroscopy, 182. 195-204 doi:10.1016/j.ultramic.2017.06.024 | ||
| Plain Text | Sawada, Hidetaka, Allen, Christopher S., Wang, Shanshan, Warner, Jamie H., Kirkland, Angus I. (2017) Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials. Ultramicroscopy, 182. 195-204 doi:10.1016/j.ultramic.2017.06.024 | ||
| In | (2017) Ultramicroscopy Vol. 182. Elsevier BV | ||
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