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(2017) Ultramicroscopy Vol. 182. Elsevier BV

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Reference TypeJournal (volume)
JournalUltramicroscopy
Year2017Volume<   182   >
PublisherElsevier BV
Mindat Ref. ID4911124Long-form Identifiermindat:1:5:4911124:8
GUID0
Full Reference(2017) Ultramicroscopy Vol. 182. Elsevier BV
Plain Text(2017) Ultramicroscopy Vol. 182. Elsevier BV
InElsevier BV (1975 - ) Ultramicroscopy

Contains

Howie, Archie (2017) Hatsujiro Hashimoto – A colourful and internationally revered electron microscopist. Ultramicroscopy, 182. doi:10.1016/j.ultramic.2017.08.008
(2017) Editorial Board. Ultramicroscopy, 182. doi:10.1016/s0304-3991(17)30398-4
Dziekoński, Cezary, Dera, Wojciech, Jarząbek, Dariusz M. (2017) Method for lateral force calibration in atomic force microscope using MEMS microforce sensor. Ultramicroscopy, 182. 1-9 doi:10.1016/j.ultramic.2017.06.012
SchĂĽrmann, U., Chluba, C., Wolff, N., Smazna, D., Lima de Miranda, R., Junker, P., Adelung, R., Quandt, E., Kienle, L. (2017) Functional NiTi grids for in situ straining in the TEM. Ultramicroscopy, 182. 10-16 doi:10.1016/j.ultramic.2017.06.003
Alkorta, Jon, Marteleur, Matthieu, Jacques, Pascal J. (2017) Improved simulation based HR-EBSD procedure using image gradient based DIC techniques. Ultramicroscopy, 182. 17-27 doi:10.1016/j.ultramic.2017.06.015
Chen, Shu Jian, Yao, Xupei, Zheng, Changxi, Duan, Wen Hui (2017) Quantification of evaporation induced error in atom probe tomography using molecular dynamics simulation. Ultramicroscopy, 182. 28-35 doi:10.1016/j.ultramic.2017.06.006
Linck, Martin, Ercius, Peter A., Pierce, Jordan S., McMorran, Benjamin J. (2017) Aberration corrected STEM by means of diffraction gratings. Ultramicroscopy, 182. 36-43 doi:10.1016/j.ultramic.2017.06.008
Mir, J.A., Clough, R., MacInnes, R., Gough, C., Plackett, R., Shipsey, I., Sawada, H., MacLaren, I., Ballabriga, R., Maneuski, D., O'Shea, V., McGrouther, D., Kirkland, A.I. (2017) Characterisation of the Medipix3 detector for 60 and 80 keV electrons. Ultramicroscopy, 182. 44-53 doi:10.1016/j.ultramic.2017.06.010
Niermann, T., Lehmann, M., Wagner, T. (2017) Gated interference for time-resolved electron holography. Ultramicroscopy, 182. 54-61 doi:10.1016/j.ultramic.2017.06.017
Thomsen, Knud, Mehnert, Klaus, Trimby, Patrick W., Gholinia, Ali (2017) Quaternion-based disorientation coloring of orientation maps. Ultramicroscopy, 182. 62-67 doi:10.1016/j.ultramic.2017.06.021
Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) Axial geometrical aberration correction up to 5th order with N-SYLC. Ultramicroscopy, 182. 68-80 doi:10.1016/j.ultramic.2017.06.014
Koeck, Philip J.B. (2017) An aperture design for single side band imaging in the transmission electron microscope. Ultramicroscopy, 182. 81-84 doi:10.1016/j.ultramic.2017.06.018
Iwasawa, Hideaki, Schwier, Eike F., Arita, Masashi, Ino, Akihiro, Namatame, Hirofumi, Taniguchi, Masaki, Aiura, Yoshihiro, Shimada, Kenya (2017) Development of laser-based scanning µ-ARPES system with ultimate energy and momentum resolutions. Ultramicroscopy, 182. 85-91 doi:10.1016/j.ultramic.2017.06.016
Vatanparast, Maryam, Egoavil, Ricardo, Reenaas, Turid W., Verbeeck, Johan, Holmestad, Randi, Vullum, Per Erik (2017) Bandgap measurement of high refractive index materials by off-axis EELS. Ultramicroscopy, 182. 92-98 doi:10.1016/j.ultramic.2017.06.019
Sajjadi, Mohammadreza, Pishkenari, Hossein Nejat, Vossoughi, Gholamreza (2017) Dynamic modeling of trolling-mode AFM: Considering effects of cantilever torsion, nanoneedle flexibility and liquid-nanoneedle interactions. Ultramicroscopy, 182. 99-111 doi:10.1016/j.ultramic.2017.06.009
Mouton, Isabelle, Printemps, Tony, Grenier, Adeline, Gambacorti, Narciso, Pinna, Elisa, Tiddia, Mariavitalia, Vacca, Annalisa, Mula, Guido (2017) Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materials. Ultramicroscopy, 182. 112-117 doi:10.1016/j.ultramic.2017.06.007
Mochalov, Konstantin E., Chistyakov, Anton A., Solovyeva, Daria O., Mezin, Alexey V., Oleinikov, Vladimir A., Vaskan, Ivan S., Molinari, Michael, Agapov, Igor I., Nabiev, Igor, Efimov, Anton E. (2017) An instrumental approach to combining confocal microspectroscopy and 3D scanning probe nanotomography. Ultramicroscopy, 182. 118-123 doi:10.1016/j.ultramic.2017.06.022
Edgcombe, C.J. (2017) Imaging with straight-edge phase plates in the TEM. Ultramicroscopy, 182. 124-130 doi:10.1016/j.ultramic.2017.06.020
Prabhat, K.C., Aditya Mohan, K., Phatak, Charudatta, Bouman, Charles, De Graef, Marc (2017) 3D reconstruction of the magnetic vector potential using model based iterative reconstruction. Ultramicroscopy, 182. 131-144 doi:10.1016/j.ultramic.2017.07.005
House, Stephen D., Chen, Yuxiang, Jin, Rongchao, Yang, Judith C. (2017) High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM. Ultramicroscopy, 182. 145-155 doi:10.1016/j.ultramic.2017.07.004
Cui, J., Yao, Y., Wang, Y.G., Shen, X., Yu, R.C. (2017) Origin of atomic displacement in HAADF image of the tilted specimen. Ultramicroscopy, 182. 156-162 doi:10.1016/j.ultramic.2017.07.007
Minoda, Hiroki, Tamai, Takayuki, Ohmori, Yuya, Iijima, Hirofumi (2017) Contrast enhancement of nanomaterials using phase plate STEM. Ultramicroscopy, 182. 163-168 doi:10.1016/j.ultramic.2017.07.006
Brown, H.G., Shibata, N., Sasaki, H., Petersen, T.C., Paganin, D.M., Morgan, M.J., Findlay, S.D. (2017) Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors. Ultramicroscopy, 182. 169-178 doi:10.1016/j.ultramic.2017.07.002
Eaton, P., Quaresma, P., Soares, C., Neves, C., de Almeida, M.P., Pereira, E., West, P. (2017) A direct comparison of experimental methods to measure dimensions of synthetic nanoparticles. Ultramicroscopy, 182. 179-190 doi:10.1016/j.ultramic.2017.07.001
Potapov, Pavel (2017) On the loss of information in PCA of spectrum-images. Ultramicroscopy, 182. 191-194 doi:10.1016/j.ultramic.2017.06.023
Sawada, Hidetaka, Allen, Christopher S., Wang, Shanshan, Warner, Jamie H., Kirkland, Angus I. (2017) Aberration measurement of the probe-forming system of an electron microscope using two-dimensional materials. Ultramicroscopy, 182. 195-204 doi:10.1016/j.ultramic.2017.06.024
Spiegelberg, Jakob, Muto, Shunsuke, Ohtsuka, Masahiro, Pelckmans, Kristiaan, Rusz, Ján (2017) Unmixing hyperspectral data by using signal subspace sampling. Ultramicroscopy, 182. 205-211 doi:10.1016/j.ultramic.2017.07.009
Masuda, Yu, Kamiya, Masashi, Sugita, Atsushi, Inami, Wataru, Kawata, Yoshimasa, Kominami, Hiroko, Nakanishi, Yoichiro (2017) Spatial resolution and cathodoluminescence intensity dependence on acceleration voltage in electron beam excitation assisted optical microscopy using Y2O3:Eu3+ film. Ultramicroscopy, 182. 212-215 doi:10.1016/j.ultramic.2017.07.010
Zorila, Florina Lucica, Ionescu, Cristina, Craciun, Liviu Stefan, Zorila, Bogdan (2017) Atomic force microscopy study of morphological modifications induced by different decontamination treatments on Escherichia coli. Ultramicroscopy, 182. 226-232 doi:10.1016/j.ultramic.2017.07.012
Mom, Rik V., Onderwaater, Willem G., Rost, Marcel J., Jankowski, Maciej, Wenzel, Sabine, Jacobse, Leon, Alkemade, Paul F.A., Vandalon, Vincent, van Spronsen, Matthijs A., van Weeren, Matthijs, Crama, Bert, van der Tuijn, Peter, Felici, Roberto, Kessels, Wilhelmus M.M., CarlĂ , Francesco, Frenken, Joost W.M., Groot, Irene M.N. (2017) Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environment. Ultramicroscopy, 182. 233-242 doi:10.1016/j.ultramic.2017.07.011
Konomi, M., Sacha, G.M. (2017) Feedforward neural network methodology to characterize thin films by Electrostatic Force Microscopy. Ultramicroscopy, 182. 243-248 doi:10.1016/j.ultramic.2017.07.015
Hasezaki, Kana L., Saito, Hikaru, Sannomiya, Takumi, Miyazaki, Hiroya, Gondo, Takashi, Miyazaki, Shinsuke, Hata, Satoshi (2017) Three-dimensional visualization of dislocations in a ferromagnetic material by magnetic-field-free electron tomography. Ultramicroscopy, 182. 249-257 doi:10.1016/j.ultramic.2017.07.016
Seki, Takehito, Sánchez-Santolino, Gabriel, Ishikawa, Ryo, Findlay, Scott D., Ikuhara, Yuichi, Shibata, Naoya (2017) Quantitative electric field mapping in thin specimens using a segmented detector: Revisiting the transfer function for differential phase contrast. Ultramicroscopy, 182. 258-263 doi:10.1016/j.ultramic.2017.07.013
MacArthur, Katherine E., Brown, Hamish G., Findlay, Scott D., Allen, Leslie J. (2017) Probing the effect of electron channelling on atomic resolution energy dispersive X-ray quantification. Ultramicroscopy, 182. 264-275 doi:10.1016/j.ultramic.2017.07.020
Latychevskaia, Tatiana, Wicki, Flavio, Escher, Conrad, Fink, Hans-Werner (2017) Imaging the potential distribution of individual charged impurities on graphene by low-energy electron holography. Ultramicroscopy, 182. 276-282 doi:10.1016/j.ultramic.2017.07.019
Bárcena-González, G., Guerrero-Lebrero, M.P., Guerrero, E., Yañez, A., Fernández-Reyes, D., González, D., Galindo, P.L. (2017) Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imaging. Ultramicroscopy, 182. 283-291 doi:10.1016/j.ultramic.2017.07.014
Sanders, Toby, Dwyer, Christian (2017) Subsampling and inpainting approaches for electron tomography. Ultramicroscopy, 182. 292-302 doi:10.1016/j.ultramic.2017.07.021
Mamishin, Shuichi, Kubo, Yudai, Cours, Robin, Monthioux, Marc, Houdellier, Florent (2017) 200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron microscopy. Ultramicroscopy, 182. 303-307 doi:10.1016/j.ultramic.2017.07.018
Börrnert, Felix, Müller, Heiko, Riedel, Thomas, Linck, Martin, Kirkland, Angus I., Haider, Max., Büchner, Bernd, Lichte, Hannes (2017) Corrigendum to: “A flexible multi-stimuli in-situ (S)TEM: Concept and optical performance” [Ultramicroscopy 151 (2015) 31–36]. Ultramicroscopy, 182. 308pp. doi:10.1016/j.ultramic.2017.06.005

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