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Tong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, Ben (2015) Pattern Overlap and High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 2045-2046 doi:10.1017/s1431927615011009

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Reference TypeJournal (article/letter/editorial)
TitlePattern Overlap and High Resolution Electron Backscatter Diffraction
JournalMicroscopy and Microanalysis
AuthorsTong, VivianAuthor
Jiang, JunAuthor
Wilkinson, AngusAuthor
Britton, BenAuthor
Year2015 (August)Volume21
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s1431927615011009Search in ResearchGate
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Mindat Ref. ID4874114Long-form Identifiermindat:1:5:4874114:9
GUID0
Full ReferenceTong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, Ben (2015) Pattern Overlap and High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 2045-2046 doi:10.1017/s1431927615011009
Plain TextTong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, Ben (2015) Pattern Overlap and High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 2045-2046 doi:10.1017/s1431927615011009
In(2015) Microscopy and Microanalysis Vol. 21. Cambridge University Press (CUP)

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Tong, Vivian, Jiang, Jun, Wilkinson, Angus J., Britton, T. Ben (2015) The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy, 155. 62-73 doi:10.1016/j.ultramic.2015.04.019
Vilalta-Clemente, Arantxa, Jiang, Jun, Britton, Ben, Collins, David M, Wilkinson, Angus (2015) Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 1891-1892 doi:10.1017/s1431927615010235
Tanaka, Tomohito, Wilkinson, Angus J (2018) High Angular Resolution Electron Backscatter Diffraction Studies of Tetragonality in Fe-C Martensitic Steels. Microscopy and Microanalysis, 24. 962-963 doi:10.1017/s1431927618005305
Koko, Abdalrhaman, Tong, Vivian, Wilkinson, Angus J., Marrow, T. James (2023) An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Ultramicroscopy, 248. 113705 doi:10.1016/j.ultramic.2023.113705
Foden, Alexander, Collins, David M., Wilkinson, Angus J., Britton, T. Benjamin (2019) Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach. Microscopy and Microanalysis, 25. 1962-1963 doi:10.1017/s1431927619010547
Vilalta-Clemente, Arantxa, Naresh-Kumar, G., Nouf-Allehiani, M., Parbrook, Peter J., Boulbar, Emmanuel D.Le, Allsopp, Duncan, Shields, Philip A., Trager-Cowan, Carol, Wilkinson, Angus J. (2015) High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors. Microscopy and Microanalysis, 21. 2217-2218 doi:10.1017/s1431927615011861
Seal, J.R., Bieler, T., Crimp, M., Britton, B., Wilkinson, A. (2012) Characterizing Slip Transfer In Commercially Pure Titanium Using High Resolution Electron Backscatter Diffraction (HR-EBSD) and Electron Channeling Contrast Imaging (ECCI). Microscopy and Microanalysis, 18. 702-703 doi:10.1017/s1431927612005363
Jiang, J., Britton, T.B., Wilkinson, A.J. (2013) Strain Mapping with Electron Back Scatter Diffraction: Sensitivity Studies and Pattern Remapping. Microscopy and Microanalysis, 19. 684-685 doi:10.1017/s1431927613005412
Wallis, David, Hansen, Lars N., Ben Britton, T., Wilkinson, Angus J. (2016) Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction. Ultramicroscopy, 168. 34-45 doi:10.1016/j.ultramic.2016.06.002
Britton, T. Ben, Goran, Daniel, Tong, Vivian S. (2019) Space Rocks and Optimizing Scanning Electron Channeling Contrast. Microscopy and Microanalysis, 25. 2446-2447 doi:10.1017/s1431927619012960
Tong, Vivian S., Ben Britton, T. (2021) TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps. Ultramicroscopy, 221. 113130pp. doi:10.1016/j.ultramic.2020.113130
 
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