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Tong, Vivian S., Ben Britton, T. (2021) TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps. Ultramicroscopy, 221. 113130pp. doi:10.1016/j.ultramic.2020.113130

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Reference TypeJournal (article/letter/editorial)
TitleTrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps
JournalUltramicroscopy
AuthorsTong, Vivian S.Author
Ben Britton, T.Author
Year2021 (February)Volume221
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2020.113130Search in ResearchGate
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Mindat Ref. ID13801447Long-form Identifiermindat:1:5:13801447:8
GUID0
Full ReferenceTong, Vivian S., Ben Britton, T. (2021) TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps. Ultramicroscopy, 221. 113130pp. doi:10.1016/j.ultramic.2020.113130
Plain TextTong, Vivian S., Ben Britton, T. (2021) TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps. Ultramicroscopy, 221. 113130pp. doi:10.1016/j.ultramic.2020.113130
In(2021) Ultramicroscopy Vol. 221. Elsevier BV

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Tong, Vivian, Jiang, Jun, Wilkinson, Angus J., Britton, T. Ben (2015) The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. Ultramicroscopy, 155. 62-73 doi:10.1016/j.ultramic.2015.04.019
Koko, Abdalrhaman, Tong, Vivian, Wilkinson, Angus J., Marrow, T. James (2023) An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD) Ultramicroscopy, 248. 113705 doi:10.1016/j.ultramic.2023.113705
Wallis, David, Hansen, Lars N., Ben Britton, T., Wilkinson, Angus J. (2016) Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction. Ultramicroscopy, 168. 34-45 doi:10.1016/j.ultramic.2016.06.002
Tong, Vivian, Jiang, Jun, Wilkinson, Angus, Britton, Ben (2015) Pattern Overlap and High Resolution Electron Backscatter Diffraction. Microscopy and Microanalysis, 21. 2045-2046 doi:10.1017/s1431927615011009
Foden, A., Collins, D.M., Wilkinson, A.J., Britton, T.B. (2019) Indexing electron backscatter diffraction patterns with a refined template matching approach. Ultramicroscopy, 207. 112845pp. doi:10.1016/j.ultramic.2019.112845
Britton, T.B., Wilkinson, A.J. (2011) Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction. Ultramicroscopy, 111 (8). 1395-1404 doi:10.1016/j.ultramic.2011.05.007
Britton, T.B., Wilkinson, A.J. (2012) High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations. Ultramicroscopy, 114. 82-95 doi:10.1016/j.ultramic.2012.01.004
Hielscher, Ralf, Bartel, Felix, Britton, Thomas Benjamin (2019) Gazing at crystal balls: Electron backscatter diffraction pattern analysis and cross correlation on the sphere. Ultramicroscopy, 207. 112836pp. doi:10.1016/j.ultramic.2019.112836
Jiang, J., Britton, T.B., Wilkinson, A.J. (2013) Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size. Ultramicroscopy, 125. 1-9 doi:10.1016/j.ultramic.2012.11.003
Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J. (2013) Assessing the precision of strain measurements using electron backscatter diffraction – part 1: Detector assessment. Ultramicroscopy, 135. 126-135 doi:10.1016/j.ultramic.2013.08.005
Britton, T.B., Jiang, J., Clough, R., Tarleton, E., Kirkland, A.I., Wilkinson, A.J. (2013) Assessing the precision of strain measurements using electron backscatter diffraction – Part 2: Experimental demonstration. Ultramicroscopy, 135. 136-141 doi:10.1016/j.ultramic.2013.08.006
 
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