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Spence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 59-64 doi:10.1016/0304-3991(81)90024-3

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Reference TypeJournal (article/letter/editorial)
TitleThe crystallographic information in localised characteristic loss electron images and diffraction patterns
JournalUltramicroscopy
AuthorsSpence, J.C.H.Author
Year1981 (January)Volume7
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(81)90024-3Search in ResearchGate
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Mindat Ref. ID4890166Long-form Identifiermindat:1:5:4890166:2
GUID0
Full ReferenceSpence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 59-64 doi:10.1016/0304-3991(81)90024-3
Plain TextSpence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 59-64 doi:10.1016/0304-3991(81)90024-3
In(1981, January) Ultramicroscopy Vol. 7 (1) Elsevier BV

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Spence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 107pp. doi:10.1016/0304-3991(81)90038-3
Steeds, J.W. (1981) Crystallographic information from convergent beam electron diffraction. Ultramicroscopy, 7 (1). 105-106 doi:10.1016/0304-3991(81)90031-0
Holmestad, R., Krivanek, O.L., Høier, R., Marthinsen, K., Spence, J.C.H. (1993) Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy, 52 (3). 454-458 doi:10.1016/0304-3991(93)90060-b
Cowley, J.M., Spence, J.C.H. (1981) Convergent beam electron microdiffraction from small crystals. Ultramicroscopy, 6 (1). 359-366 doi:10.1016/s0304-3991(81)80222-7
Spence, J.C.H. (1985) The structural sensitivity of electron energy-loss near-edge structure (ELNES). Ultramicroscopy, 18 (1). 165-172 doi:10.1016/0304-3991(85)90134-2
Spence, J.C.H., Lynch, J. (1982) Stem microanalysis by transmission electron energy loss spectroscopy in crystals. Ultramicroscopy, 9 (3). 267-276 doi:10.1016/0304-3991(82)90211-x
Spence, J.C.H. (1994) Reflection electron microscopy of buried interfaces in the transmission geometry. Ultramicroscopy, 55 (3). 293-301 doi:10.1016/0304-3991(94)90064-7
Spence, J.C.H. (1983) High energy transmission electron diffraction and imaging studies of the silicon (111) 7 × 7 surface structure. Ultramicroscopy, 11 (2). 117-124 doi:10.1016/0304-3991(83)90226-7
Burge, R.E., Wu, Jian Kang (1981) Compression of image information in electron images. Ultramicroscopy, 7 (2). 169-180 doi:10.1016/0304-3991(81)90007-3
Humphreys, C.J., Payne, S.M. (1981) Wavon radiation in electron diffraction. Ultramicroscopy, 7 (1). 108pp. doi:10.1016/0304-3991(81)90041-3
Rossouw, C.J. (1981) Localization effects in electron energy loss signals: Phenomena induced in characteristic loss rocking curves. Ultramicroscopy, 7 (2). 139-145 doi:10.1016/0304-3991(81)90003-6
 
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