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Holmestad, R., Krivanek, O.L., Høier, R., Marthinsen, K., Spence, J.C.H. (1993) Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy, 52 (3). 454-458 doi:10.1016/0304-3991(93)90060-b

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Reference TypeJournal (article/letter/editorial)
TitleCommercial spectrometer modifications for energy filtering of electron diffraction patterns and images
JournalUltramicroscopy
AuthorsHolmestad, R.Author
Krivanek, O.L.Author
Høier, R.Author
Marthinsen, K.Author
Spence, J.C.H.Author
Year1993 (December)Volume52
Issue3
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(93)90060-bSearch in ResearchGate
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Mindat Ref. ID4897811Long-form Identifiermindat:1:5:4897811:4
GUID0
Full ReferenceHolmestad, R., Krivanek, O.L., Høier, R., Marthinsen, K., Spence, J.C.H. (1993) Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy, 52 (3). 454-458 doi:10.1016/0304-3991(93)90060-b
Plain TextHolmestad, R., Krivanek, O.L., Høier, R., Marthinsen, K., Spence, J.C.H. (1993) Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy, 52 (3). 454-458 doi:10.1016/0304-3991(93)90060-b
In(1993, December) Ultramicroscopy Vol. 52 (3) Elsevier BV

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Høier, R., Zuo, J.-M., Marthinsen, K., Spence, J.C.H. (1988) Determination of structure factor phase invariants from non-systematic many-beam effects in convergent-beam patterns. Ultramicroscopy, 26 (1). 25-30 doi:10.1016/0304-3991(88)90372-5
Spence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 107pp. doi:10.1016/0304-3991(81)90038-3
Krivanek, O.L., Disko, M.M., Taftø, J., Spence, J.C.H. (1982) Electron energy loss spectroscopy as a probe of the local atomic environment. Ultramicroscopy, 9 (3). 249-254 doi:10.1016/0304-3991(82)90208-x
Spence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 59-64 doi:10.1016/0304-3991(81)90024-3
Birkeland, C, Holmestad, R, Marthinsen, K, Høier, R (1996) Efficient beam-selection criteria in quantitative convergent beam electron diffraction. Ultramicroscopy, 66 (1). 89-99 doi:10.1016/s0304-3991(96)00082-4
Marthinsen, Knut, Holmestad, Randi, Høier, Ragnvald (1994) Analytical filtering of low-angle inelastic scattering contributions toCBED contrast. Ultramicroscopy, 55 (3). 268-275 doi:10.1016/0304-3991(94)90061-2
Marthinsen, K., Anisdahl, L., Høier, R. (1988) Interpretation of electron channeling patterns from non-centrosymmetric crystals. Ultramicroscopy, 24 (1). 72-73 doi:10.1016/0304-3991(88)90348-8
Marthinsen, K., Høier, R. (1983) Structure factor phase information in selected area channeling patterns. Ultramicroscopy, 12 (3). 271-272 doi:10.1016/0304-3991(83)90284-x
Krivanek, O.L., Mooney, P.E. (1993) Applications of slow-scan CCD cameras in transmission electron microscopy. Ultramicroscopy, 49 (1). 95-108 doi:10.1016/0304-3991(93)90216-k
Spence, J.C.H., Qian, W., Melmed, A.J. (1993) Experimental low-voltage point-projection microscopy and its possibilities. Ultramicroscopy, 52 (3). 473-477 doi:10.1016/0304-3991(93)90063-4
Høier, R., Holmestad, R., Marthinsen, K. (1993) Structure factor determination from energy-filtered CBED patterns. Acta Crystallographica Section A Foundations of Crystallography, 49. doi:10.1107/s0108767378098840
 
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