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Spence, J.C.H., Qian, W., Melmed, A.J. (1993) Experimental low-voltage point-projection microscopy and its possibilities. Ultramicroscopy, 52 (3). 473-477 doi:10.1016/0304-3991(93)90063-4

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Reference TypeJournal (article/letter/editorial)
TitleExperimental low-voltage point-projection microscopy and its possibilities
JournalUltramicroscopy
AuthorsSpence, J.C.H.Author
Qian, W.Author
Melmed, A.J.Author
Year1993 (December)Volume52
Issue3
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(93)90063-4Search in ResearchGate
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Mindat Ref. ID4897818Long-form Identifiermindat:1:5:4897818:7
GUID0
Full ReferenceSpence, J.C.H., Qian, W., Melmed, A.J. (1993) Experimental low-voltage point-projection microscopy and its possibilities. Ultramicroscopy, 52 (3). 473-477 doi:10.1016/0304-3991(93)90063-4
Plain TextSpence, J.C.H., Qian, W., Melmed, A.J. (1993) Experimental low-voltage point-projection microscopy and its possibilities. Ultramicroscopy, 52 (3). 473-477 doi:10.1016/0304-3991(93)90063-4
In(1993, December) Ultramicroscopy Vol. 52 (3) Elsevier BV

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Lo, W.K., Spence, J.C.H. (1993) Investigation of STM image artifacts by in-situ reflection electron microscopy. Ultramicroscopy, 48 (4). 433-444 doi:10.1016/0304-3991(93)90119-i
Smith, David J., Spence, John C.H. (1993) Foreword. Ultramicroscopy, 52 (3). doi:10.1016/0304-3991(93)90027-u
Holmestad, R., Krivanek, O.L., Høier, R., Marthinsen, K., Spence, J.C.H. (1993) Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images. Ultramicroscopy, 52 (3). 454-458 doi:10.1016/0304-3991(93)90060-b
Spence, J.C.H. (1994) Reflection electron microscopy of buried interfaces in the transmission geometry. Ultramicroscopy, 55 (3). 293-301 doi:10.1016/0304-3991(94)90064-7
Spence, J.C.H. (1979) Uniqueness and the inversion problem of incoherent multiple scattering. Ultramicroscopy, 4 (1). 9-12 doi:10.1016/0304-3991(79)90004-4
Saldin, D.K., Spence, J.C.H. (1994) On the mean inner potential in high- and low-energy electron diffraction. Ultramicroscopy, 55 (4). 397-406 doi:10.1016/0304-3991(94)90175-9
Spence, J., Qian, W., Zhang, X. (1994) Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V. Ultramicroscopy, 55 (1). 19-23 doi:10.1016/0304-3991(94)90076-0
Sakurai, T., Melmed, A.J. (1979) Field ion microscopy of silicon. Ultramicroscopy, 4 (3). 380pp. doi:10.1016/s0304-3991(79)80166-7
Melmed, A.J., Camus, P.P. (1991) Composite thin-film characterization by atom probe field ion microscopy. Ultramicroscopy, 35 (3). 277-287 doi:10.1016/0304-3991(91)90080-p
Spence, J.C.H., Lo, W., Kuwabara, M. (1990) Observation of the graphite surface by reflection electron microscopy during STM operation. Ultramicroscopy, 33 (2). 69-82 doi:10.1016/0304-3991(90)90009-b
Spence, J.C.H. (1981) The crystallographic information in localised characteristic loss electron images and diffraction patterns. Ultramicroscopy, 7 (1). 107pp. doi:10.1016/0304-3991(81)90038-3
 
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