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(1987, January) Ultramicroscopy Vol. 23 (3) Elsevier BV

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Reference TypeJournal (issue)
JournalUltramicroscopy
Year1987 (January)Volume23
Issue<   3
PublisherElsevier BV
Mindat Ref. ID4893670Long-form Identifiermindat:1:5:4893670:1
GUID0
Full Reference(1987, January) Ultramicroscopy Vol. 23 (3) Elsevier BV
Plain Text(1987, January) Ultramicroscopy Vol. 23 (3) Elsevier BV
In(1987) Ultramicroscopy Vol. 23. Elsevier BV

Contains

(1987) Foreword. Ultramicroscopy, 23 (3). 259-260 doi:10.1016/0304-3991(87)90233-6
Ou, H.-J., Cowley, J.M. (1987) Study of freshly deposited metallic particles on MgO crystal surfaces by scanning reflection electron microscopy. Ultramicroscopy, 23 (3). 263-269 doi:10.1016/0304-3991(87)90234-8
Poppa, H., Moorhead, R.D. (1987) The use of RF-plasma reactions for in-situ transmission electron microscopy studies. Ultramicroscopy, 23 (3). 271-274 doi:10.1016/0304-3991(87)90235-x
Kang, Z.C., Eyring, L. (1987) Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal. Ultramicroscopy, 23 (3). 275-281 doi:10.1016/0304-3991(87)90236-1
Ehrlich, D.J., Rothschild, M., Black, J.G. (1987) Laser photochemical reactions. Ultramicroscopy, 23 (3). 283-289 doi:10.1016/0304-3991(87)90237-3
Lichtman, David (1987) Some electron-induced changes at surfaces. Ultramicroscopy, 23 (3). 291-297 doi:10.1016/0304-3991(87)90238-5
Smith, David J., McCartney, M.R., Bursill, L.A. (1987) The electron-beam-induced reduction of transition metal oxide surfaces to metallic lower oxides. Ultramicroscopy, 23 (3). 299-303 doi:10.1016/0304-3991(87)90239-7
Egerton, R.F., Crozier, P.A., Rice, P. (1987) Electron energy-loss spectroscopy and chemical change. Ultramicroscopy, 23 (3). 305-312 doi:10.1016/0304-3991(87)90240-3
Disko, M.M., Treacy, M.M.J., Rice, S.B., Chianelli, R.R., Gland, J.A., Halbert, T.R., Ruppert, A.F. (1987) Spatially resolved electron energy-loss spectroscopy of MoS2 platelets. Ultramicroscopy, 23 (3). 313-319 doi:10.1016/0304-3991(87)90241-5
Fryer, J.R. (1987) The effect of dose rate on imaging aromatic organic crystals. Ultramicroscopy, 23 (3). 321-327 doi:10.1016/0304-3991(87)90242-7
Vesely, D., Finch, D.S. (1987) Chemical changes in electron-beam-irradiated polymers. Ultramicroscopy, 23 (3). 329-337 doi:10.1016/0304-3991(87)90243-9
Hobbs, Linn W. (1987) Electron-beam sensitivity in inorganic specimens. Ultramicroscopy, 23 (3). 339-344 doi:10.1016/0304-3991(87)90244-0
King, Wayne E., Benedek, R., Merkle, K.L., Meshii, M. (1987) Damage effects of high energy electrons on metals. Ultramicroscopy, 23 (3). 345-353 doi:10.1016/0304-3991(87)90245-2
Shiojiri, Makoto, Isshiki, Toshiyuki, Okashita, Kazuhiko, Hirota, Yoshihiro, Maeda, Takashi, Sekimoto, Sunao (1987) High-resolution transmission electron microscopic observations of grain boundaries and surfaces on Cuî—¸Te crystals grown by a solid-solid reaction. Ultramicroscopy, 23 (3). 355-363 doi:10.1016/0304-3991(87)90246-4
Dahmen, U., Kim, M.G., Searcy, A.W. (1987) Microstructural evolution during the decomposition of Mg(OH)2. Ultramicroscopy, 23 (3). 365-370 doi:10.1016/0304-3991(87)90247-6
Van Landuyt, J., Van Tendeloo, G., Amelinckx, S. (1987) Phase transformations as studied by electron microscopy. Ultramicroscopy, 23 (3). 371-382 doi:10.1016/0304-3991(87)90248-8
Sinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
Davies, Peter K., Garzon, Fernando H. (1987) Structural transitions in ionic conductors and optical materials. Ultramicroscopy, 23 (3). 397-404 doi:10.1016/0304-3991(87)90250-6
Smith, D.A., Tu, K.N., Weiss, B.Z. (1987) Crystallization, resistivity and microstructure of co-deposited metal-silicon thin film alloys. Ultramicroscopy, 23 (3). 405-410 doi:10.1016/0304-3991(87)90251-8
Treacy, M.M.J., Newsam, J.M. (1987) Electron beam sensitivity of zeolite L. Ultramicroscopy, 23 (3). 411-419 doi:10.1016/0304-3991(87)90252-x
Csencsits, R., Gronsky, R. (1987) Damage of zeolite Y in the TEM and its effects on TEM images. Ultramicroscopy, 23 (3). 421-431 doi:10.1016/0304-3991(87)90253-1
Raynerd, G., Venables, J.A. (1987) Transmission electron diffraction and microscopy of condensed sulphur hexaflouride. Ultramicroscopy, 23 (3). 433-442 doi:10.1016/0304-3991(87)90254-3
Schweda, E., Eyring, L., Smith, Davud J. (1987) Structural transformation and chemical reduction of Pr24O44 induced by the electron beam during microscopical examination. Ultramicroscopy, 23 (3). 443-451 doi:10.1016/0304-3991(87)90255-5
Sharma, Renu, Barry, John, Eyring, LeRoy (1987) Electron-induced decomposition of rubidium chromium fluoride. Ultramicroscopy, 23 (3). 453-461 doi:10.1016/0304-3991(87)90256-7
Liu, J., Cowley, J.M. (1987) High-resolution scanning electron microscopy of surface reactions. Ultramicroscopy, 23 (3). 463-472 doi:10.1016/0304-3991(87)90257-9
(1987) Author index to volume 23. Ultramicroscopy, 23 (3). 473-475 doi:10.1016/0304-3991(87)90258-0
(1987) Subject index to volume 23. Ultramicroscopy, 23 (3). 476-478 doi:10.1016/0304-3991(87)90259-2

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