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Sinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x

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Reference TypeJournal (article/letter/editorial)
TitleIn situ high-resolution electron microscopy reactions in semiconductors
JournalUltramicroscopy
AuthorsSinclair, R.Author
Parker, M.A.Author
Kim, K.B.Author
Year1987 (January)Volume23
Issue3
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(87)90249-xSearch in ResearchGate
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Mindat Ref. ID4893706Long-form Identifiermindat:1:5:4893706:5
GUID0
Full ReferenceSinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
Plain TextSinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
In(1987, January) Ultramicroscopy Vol. 23 (3) Elsevier BV

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Sinclair, R., Morgiel, J., Kirtikar, A.S., Wu, I.-W., Chiang, A. (1993) Direct observation of crystallization in silicon by in situ high-resolution electron microscopy. Ultramicroscopy, 51 (1). 41-45 doi:10.1016/0304-3991(93)90134-j
Kang, Z.C., Eyring, L. (1987) Surface processes observed by high-resolution electron microscopy: Beam-induced transformation and reduction in a modified β-PbO2 crystal. Ultramicroscopy, 23 (3). 275-281 doi:10.1016/0304-3991(87)90236-1
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Zandbergen, H.W., Weyher, J., Van Landuyt, J. (1987) High resolution electron microscopy and photoetching on twins in GaAs. Ultramicroscopy, 21 (2). 207pp. doi:10.1016/0304-3991(87)90144-6
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