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Sinclair, R., Morgiel, J., Kirtikar, A.S., Wu, I.-W., Chiang, A. (1993) Direct observation of crystallization in silicon by in situ high-resolution electron microscopy. Ultramicroscopy, 51 (1). 41-45 doi:10.1016/0304-3991(93)90134-j

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Reference TypeJournal (article/letter/editorial)
TitleDirect observation of crystallization in silicon by in situ high-resolution electron microscopy
JournalUltramicroscopy
AuthorsSinclair, R.Author
Morgiel, J.Author
Kirtikar, A.S.Author
Wu, I.-W.Author
Chiang, A.Author
Year1993 (June)Volume51
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(93)90134-jSearch in ResearchGate
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Mindat Ref. ID4897625Long-form Identifiermindat:1:5:4897625:9
GUID0
Full ReferenceSinclair, R., Morgiel, J., Kirtikar, A.S., Wu, I.-W., Chiang, A. (1993) Direct observation of crystallization in silicon by in situ high-resolution electron microscopy. Ultramicroscopy, 51 (1). 41-45 doi:10.1016/0304-3991(93)90134-j
Plain TextSinclair, R., Morgiel, J., Kirtikar, A.S., Wu, I.-W., Chiang, A. (1993) Direct observation of crystallization in silicon by in situ high-resolution electron microscopy. Ultramicroscopy, 51 (1). 41-45 doi:10.1016/0304-3991(93)90134-j
In(1993, June) Ultramicroscopy Vol. 51 (1) Elsevier BV

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Pénisson, J.M. (1993) Detection of substitutional atoms in a γ′ phase by high-resolution electron microscopy. Ultramicroscopy, 51 (1). 264-269 doi:10.1016/0304-3991(93)90152-n
Sinclair, R., Parker, M.A., Kim, K.B. (1987) In situ high-resolution electron microscopy reactions in semiconductors. Ultramicroscopy, 23 (3). 383-395 doi:10.1016/0304-3991(87)90249-x
Kang, Z.C., Eyring, L. (1993) Analysis of time-resolved, in-situ change in high-resolution electron microscopy. Ultramicroscopy, 52 (3). 377-382 doi:10.1016/0304-3991(93)90049-4
Liu, J., Cowley, J.M. (1993) High-resolution scanning transmission electron microscopy. Ultramicroscopy, 52 (3). 335-346 doi:10.1016/0304-3991(93)90044-x
Wang, Z.L., Bentley, J. (1993) In-situ dynamic processes on cleaved α-alumina bulk crystal surfaces imaged by reflection electron microscopy. Ultramicroscopy, 51 (1). 64-80 doi:10.1016/0304-3991(93)90136-l
Lichte, Hannes (1993) Parameters for high-resolution electron holography. Ultramicroscopy, 51 (1). 15-20 doi:10.1016/0304-3991(93)90131-g
Lo, W.K., Spence, J.C.H. (1993) Investigation of STM image artifacts by in-situ reflection electron microscopy. Ultramicroscopy, 48 (4). 433-444 doi:10.1016/0304-3991(93)90119-i
Takayanagi, Kunio (1982) High resolution surface study by In-situ UHV transmission electron microscopy. Ultramicroscopy, 8 (1). 145-161 doi:10.1016/0304-3991(82)90284-4
Smith, David J., Bursill, L.A. (1985) “Metallisation” of oxide surfaces observed by in situ high-resolution electron microscopy. Ultramicroscopy, 17 (4). 387-391 doi:10.1016/0304-3991(85)90206-2
Ko, Dae-Hong, Sinclair, Robert (1994) In-situ dynamic high-resolution transmission electron microscopy: application to Pt/GaAs interfacial reactions. Ultramicroscopy, 54 (2). 166-178 doi:10.1016/0304-3991(94)90115-5
Thust, A., Urban, K. (1992) Quantitative high-speed matching of high-resolution electron microscopy images. Ultramicroscopy, 45 (1). 23-42 doi:10.1016/0304-3991(92)90035-i
 
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