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(1993, June) Ultramicroscopy Vol. 51 (1) Elsevier BV

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Reference TypeJournal (issue)
JournalUltramicroscopy
Year1993 (June)Volume51
Issue1
PublisherElsevier BV
Mindat Ref. ID4897612Long-form Identifiermindat:1:5:4897612:5
GUID0
Full Reference(1993, June) Ultramicroscopy Vol. 51 (1) Elsevier BV
Plain Text(1993, June) Ultramicroscopy Vol. 51 (1) Elsevier BV
In(1993) Ultramicroscopy Vol. 51. Elsevier BV

Contains

(1993) Editorial Board. Ultramicroscopy, 51 (1). doi:10.1016/0304-3991(93)90128-k
(1993) Foreword. Ultramicroscopy, 51 (1). doi:10.1016/0304-3991(93)90129-l
Joy, David C., Zhang, Y.-S., Zhang, X., Hashimoto, T., Bunn, R.D., Allard, L., Nolan, T.A. (1993) Practical aspects of electron holography. Ultramicroscopy, 51 (1). 1-14 doi:10.1016/0304-3991(93)90130-p
Lichte, Hannes (1993) Parameters for high-resolution electron holography. Ultramicroscopy, 51 (1). 15-20 doi:10.1016/0304-3991(93)90131-g
Zhang, Xiao, Joy, D.C., Zhang, Y., Hashimoto, T., Allard, L., Nolan, T.A. (1993) Electron holography techniques for study of ferroelectric domain walls. Ultramicroscopy, 51 (1). 21-30 doi:10.1016/0304-3991(93)90132-h
Mori, H., Komatsu, M., Fujita, H. (1993) Topics in in-situ experiments in the HVEM. Ultramicroscopy, 51 (1). 31-40 doi:10.1016/0304-3991(93)90133-i
Sinclair, R., Morgiel, J., Kirtikar, A.S., Wu, I.-W., Chiang, A. (1993) Direct observation of crystallization in silicon by in situ high-resolution electron microscopy. Ultramicroscopy, 51 (1). 41-45 doi:10.1016/0304-3991(93)90134-j
Chang, Y.C., Howe, J.M. (1993) In situ HRTEM study of Ω precipitate dissolution in an Al-Cu-Mg-Ag alloy. Ultramicroscopy, 51 (1). 46-63 doi:10.1016/0304-3991(93)90135-k
Wang, Z.L., Bentley, J. (1993) In-situ dynamic processes on cleaved α-alumina bulk crystal surfaces imaged by reflection electron microscopy. Ultramicroscopy, 51 (1). 64-80 doi:10.1016/0304-3991(93)90136-l
Hackney, S.A., Lillo, T.M., Kedia, R.S., Horn, Q.C., Plichta, M.R. (1993) Edge instabilities in thin plates studied by in situ transmission electron microscopy. Ultramicroscopy, 51 (1). 81-89 doi:10.1016/0304-3991(93)90137-m
Amelinckx, S., Milat, O., Van Tendeloo, G. (1993) Selective imaging of sublattices in complex structures. Ultramicroscopy, 51 (1). 90-108 doi:10.1016/0304-3991(93)90138-n
Kim, H.S., Sheinin, S.S. (1993) On effects of exit and entrance surface inclination on structure images. Ultramicroscopy, 51 (1). 109-116 doi:10.1016/0304-3991(93)90139-o
Pike, W.T. (1993) Energy-filtered microdiffraction in a dedicated scanning transmission electron microscope. Ultramicroscopy, 51 (1). 117-127 doi:10.1016/0304-3991(93)90140-s
King, Wayne E., Campbell, Geoffrey H. (1993) Determination of thickness and defocus by quantitative comparison of experimental and simulated high-resolution images. Ultramicroscopy, 51 (1). 128-135 doi:10.1016/0304-3991(93)90141-j
Maier, H.J., Renner, H., Mughrabi, H. (1993) Local lattice parameter measurements in cyclically deformed copper by convergent-beam electron diffraction. Ultramicroscopy, 51 (1). 136-145 doi:10.1016/0304-3991(93)90142-k
Gubbens, Alexander J., Krivanek, Ondrej L. (1993) Applications of a post-column imaging filter in biology and materials science. Ultramicroscopy, 51 (1). 146-159 doi:10.1016/0304-3991(93)90143-l
Michael, J.R., Plimpton, S.J., Romig, A.D. (1993) Parallel simulation of electron-solid interactions: A rapid aid for electron microscope data interpretation. Ultramicroscopy, 51 (1). 160-167 doi:10.1016/0304-3991(93)90144-m
Van Tendeloo, G., Amelinckx, S., Muto, S., Verheijen, M.A., van Loosdrecht, P.H.M., Meijer, G. (1993) Structures and phase transitions in C60 and C70 fullerites. Ultramicroscopy, 51 (1). 168-188 doi:10.1016/0304-3991(93)90145-n
Pirouz, P., Yang, J.W. (1993) Polytypic transformations in SiC: the role of TEM. Ultramicroscopy, 51 (1). 189-214 doi:10.1016/0304-3991(93)90146-o
Olsson, E., Ekenstedt, M.J., Wang, S.-M., Qu, H., Andersson, T.G. (1993) Contradictory increase of critical layer thickness in InxGa1−xSb/GaAs heterostructures grown by MBE. Ultramicroscopy, 51 (1). 215-220 doi:10.1016/0304-3991(93)90147-p
Bauer, S., Rosenauer, A., Link, P., Kuhn, W., Zweck, J., Gebhardt, W. (1993) Misfit dislocations in epitaxial ZnTe/GaAs (001) studied by HRTEM. Ultramicroscopy, 51 (1). 221-227 doi:10.1016/0304-3991(93)90148-q
Carim, A.H., Mitchell, T.E. (1993) 90° boundaries and associated interfacial and stand-off partial dislocations in YBa2Cu3O7−x. Ultramicroscopy, 51 (1). 228-238 doi:10.1016/0304-3991(93)90149-r
Alarco, J.A., Olsson, E., Ivanov, Z.G., Nilsson, P.Å., Winkler, D., Stepantsov, E.A., Tzalenchuk, A.Ya. (1993) Microstructure of an artificial grain boundary weak link in an YBa2Cu3O7−σ thin film grown on a (100)(110), [001]-tilt Y-ZrO2 bicrystal. Ultramicroscopy, 51 (1). 239-246 doi:10.1016/0304-3991(93)90150-v
Campbell, Geoffrey H., Wien, Walter L., King, Wayne E., Foiles, Stephen M., Rühle, Manfred (1993) High-resolution electron microscopy investigation of the (710) twin in Nb. Ultramicroscopy, 51 (1). 247-263 doi:10.1016/0304-3991(93)90151-m
Pénisson, J.M. (1993) Detection of substitutional atoms in a γ′ phase by high-resolution electron microscopy. Ultramicroscopy, 51 (1). 264-269 doi:10.1016/0304-3991(93)90152-n
Loubradou, M., Pénisson, J.M., Bonnet, R. (1993) Structural ledges at precipitate/matrix interfaces in a (Ni, Co) superalloy: atomic structures and elastic fields. Ultramicroscopy, 51 (1). 270-281 doi:10.1016/0304-3991(93)90153-o
Ramachandran, Anita S., Anderson, Shane L., Datye, Abhaya K. (1993) The effect of adsorbate and pretreatment on the shape and reactivity of silica-supported platinum particles. Ultramicroscopy, 51 (1). 282-297 doi:10.1016/0304-3991(93)90154-p
Zhang, Bing, Krishnan, Kannan M., Farrow, Robin F.C. (1993) Crystallography of Co/Pt multilayers and nanostructures. Ultramicroscopy, 51 (1). 298-305 doi:10.1016/0304-3991(93)90155-q
De Veirman, A.E.M., Hakkens, F.J.G., Dirks, A.G. (1993) Cross-sectional transmission electron microscopy studies of metallic multilayers. Ultramicroscopy, 51 (1). 306-315 doi:10.1016/0304-3991(93)90156-r
Chen, Wen-Jauh, Chen, Fu-Rong (1993) HRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si. Ultramicroscopy, 51 (1). 316-327 doi:10.1016/0304-3991(93)90157-s
Smith, David A., Small, Martin, Stanis, Carol (1993) Electron microscopy of the grain structure of metal films and lines. Ultramicroscopy, 51 (1). 328-338 doi:10.1016/0304-3991(93)90158-t
Wang, L.M., Miller, M.L., Ewing, R.C. (1993) HRTEM study of displacement cascade damage in krypton-ion-irradiated silicate — olivine. Ultramicroscopy, 51 (1). 339-347 doi:10.1016/0304-3991(93)90159-u
(1993) Author index to volume 51. Ultramicroscopy, 51 (1). 349-350 doi:10.1016/0304-3991(93)90160-y
(1993) Subject guide to volume 51. Ultramicroscopy, 51 (1). 351pp. doi:10.1016/0304-3991(93)90161-p
(1993) Subject index to volume 51. Ultramicroscopy, 51 (1). 352-353 doi:10.1016/0304-3991(93)90162-q

See Also

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