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Chen, Wen-Jauh, Chen, Fu-Rong (1993) HRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si. Ultramicroscopy, 51 (1). 316-327 doi:10.1016/0304-3991(93)90157-s

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Reference TypeJournal (article/letter/editorial)
TitleHRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si
JournalUltramicroscopy
AuthorsChen, Wen-JauhAuthor
Chen, Fu-RongAuthor
Year1993 (June)Volume51
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(93)90157-sSearch in ResearchGate
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Mindat Ref. ID4897675Long-form Identifiermindat:1:5:4897675:4
GUID0
Full ReferenceChen, Wen-Jauh, Chen, Fu-Rong (1993) HRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si. Ultramicroscopy, 51 (1). 316-327 doi:10.1016/0304-3991(93)90157-s
Plain TextChen, Wen-Jauh, Chen, Fu-Rong (1993) HRTEM study of atomic faceting of asymmetrical twin and asymmetrical hetero-twin boundaries in NiSi2/Si. Ultramicroscopy, 51 (1). 316-327 doi:10.1016/0304-3991(93)90157-s
In(1993, June) Ultramicroscopy Vol. 51 (1) Elsevier BV

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Chen, Wen-Jauh, Chen, Fu-Rong (1993) The atomic structure of Σ = 1 and Σ = 3 NiSi2/Si interfaces. Philosophical Magazine A, 68 (3). 605-630 doi:10.1080/01418619308213985
Chen, W.J., Chen, F.-R. (1995) HRTEM Study of Atomic Faceting Interfaces of Σ=3 NiSi2/Si on (011) Si Substrate. Materials Science Forum, 189. 135-142 doi:10.4028/www.scientific.net/msf.189-190.135
Wang, L.M., Miller, M.L., Ewing, R.C. (1993) HRTEM study of displacement cascade damage in krypton-ion-irradiated silicate — olivine. Ultramicroscopy, 51 (1). 339-347 doi:10.1016/0304-3991(93)90159-u
Zandbergen, H.W., van der Berg, J., Kes, P.H. (1989) HREM on (110) mirror twin boundaries and [100] 90° rotation twin boundaries in 1-2-3 type semiconductors. Ultramicroscopy, 31 (4). 486pp. doi:10.1016/0304-3991(89)90426-9
Chang, Y.C., Howe, J.M. (1993) In situ HRTEM study of Ω precipitate dissolution in an Al-Cu-Mg-Ag alloy. Ultramicroscopy, 51 (1). 46-63 doi:10.1016/0304-3991(93)90135-k
Oei, Y.S., Schapink, F.W., Radelaar, S. (1984) Structure of twin boundaries in silicon studied by tem. Ultramicroscopy, 15 (4). 403pp. doi:10.1016/0304-3991(84)90184-0
(1993) Foreword. Ultramicroscopy, 51 (1). doi:10.1016/0304-3991(93)90129-l
Campbell, Geoffrey H., Wien, Walter L., King, Wayne E., Foiles, Stephen M., Rühle, Manfred (1993) High-resolution electron microscopy investigation of the (710) twin in Nb. Ultramicroscopy, 51 (1). 247-263 doi:10.1016/0304-3991(93)90151-m
(1993) Editorial Board. Ultramicroscopy, 51 (1). doi:10.1016/0304-3991(93)90128-k
Bauer, S., Rosenauer, A., Link, P., Kuhn, W., Zweck, J., Gebhardt, W. (1993) Misfit dislocations in epitaxial ZnTe/GaAs (001) studied by HRTEM. Ultramicroscopy, 51 (1). 221-227 doi:10.1016/0304-3991(93)90148-q
(1993) Subject guide to volume 51. Ultramicroscopy, 51 (1). 351pp. doi:10.1016/0304-3991(93)90161-p
 
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