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Kuroda, K., Morita, C., Arai, S., Yokoi, N., Saka, H. (1991) Convergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments. Ultramicroscopy, 39 (1). 58-64 doi:10.1016/0304-3991(91)90182-6

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Reference TypeJournal (article/letter/editorial)
TitleConvergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments
JournalUltramicroscopy
AuthorsKuroda, K.Author
Morita, C.Author
Arai, S.Author
Yokoi, N.Author
Saka, H.Author
Year1991 (November)Volume39
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(91)90182-6Search in ResearchGate
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Mindat Ref. ID4896049Long-form Identifiermindat:1:5:4896049:8
GUID0
Full ReferenceKuroda, K., Morita, C., Arai, S., Yokoi, N., Saka, H. (1991) Convergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments. Ultramicroscopy, 39 (1). 58-64 doi:10.1016/0304-3991(91)90182-6
Plain TextKuroda, K., Morita, C., Arai, S., Yokoi, N., Saka, H. (1991) Convergent-beam electron diffraction in the high-voltage electron microscope with continuously variable reference voltage for lenses and alignments. Ultramicroscopy, 39 (1). 58-64 doi:10.1016/0304-3991(91)90182-6
In(1991, November) Ultramicroscopy Vol. 39 (1) Elsevier BV

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Ura, K. (1991) Design concept of a new ultra-high-voltage electron microscope at Osaka University. Ultramicroscopy, 39 (1). 1-7 doi:10.1016/0304-3991(91)90176-7
Matsumura, S., Ohboshi, T., Oki, K., Tomokiyo, Y. (1991) High-voltage electron diffraction study of structure factors of Pd and Pt. Ultramicroscopy, 39 (1). 65-71 doi:10.1016/0304-3991(91)90183-7
Sumida, Naoto, Ikeda, Kazutoyo (1991) Cross-sectional observations of gold-silicon reaction on silicon substrate in situ in the high-voltage electron microscope. Ultramicroscopy, 39 (1). 313-320 doi:10.1016/0304-3991(91)90211-n
Seeger, Alfred, Phillipp, Fritz (1991) High-voltage electron microscopy in the Federal Republic of Germany: past, present, and future. Ultramicroscopy, 39 (1). 32-44 doi:10.1016/0304-3991(91)90179-a
Xu, Peirong, Loane, Russell F., Silcox, John (1991) Energy-filtered convergent-beam electron diffraction in STEM. Ultramicroscopy, 38 (2). 127-133 doi:10.1016/0304-3991(91)90113-k
Fujita, Hiroshi (1991) Atom clusters — new applications of high-voltage electron microscopy “micro-laboratory” to materials science. Ultramicroscopy, 39 (1). 369-381 doi:10.1016/0304-3991(91)90217-t
Deininger, C., Necker, G., Mayer, J. (1994) Determination of structure factors, lattice strains and accelerating voltage by energy-filtered convergent beam electron diffraction. Ultramicroscopy, 54 (1). 15-30 doi:10.1016/0304-3991(94)90089-2
Ishizuka, K. (1982) Translation symmetries in convergent-beam electron diffraction. Ultramicroscopy, 9 (3). 255-257 doi:10.1016/0304-3991(82)90209-1
De Blasi, C., Manno, D. (1991) Analysis of extended defects in melt-grown GaSe single crystals by convergent-beam electron diffraction techniques. Ultramicroscopy, 35 (2). 71-76 doi:10.1016/0304-3991(91)90092-k
Yoshida, Kiyokazu, Takaoka, Akio, Ura, Katsumi, Katsuta, Teiji, Matsui, Isao (1991) Grooved fluorescent plate for parallel-detection electron energy loss spectroscopy in ultra-high-voltage electron microscopy. Ultramicroscopy, 39 (1). 45-49 doi:10.1016/0304-3991(91)90180-e
Duan, X.F., Fung, K.K. (1991) Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices. Ultramicroscopy, 36 (4). 375-384 doi:10.1016/0304-3991(91)90129-t
 
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