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Kiritani, Michio (1991) History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids. Ultramicroscopy, 39 (1). 135-159 doi:10.1016/0304-3991(91)90193-a

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Reference TypeJournal (article/letter/editorial)
TitleHistory, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids
JournalUltramicroscopy
AuthorsKiritani, MichioAuthor
Year1991 (November)Volume39
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0304-3991(91)90193-aSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4896075Long-form Identifiermindat:1:5:4896075:3
GUID0
Full ReferenceKiritani, Michio (1991) History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids. Ultramicroscopy, 39 (1). 135-159 doi:10.1016/0304-3991(91)90193-a
Plain TextKiritani, Michio (1991) History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids. Ultramicroscopy, 39 (1). 135-159 doi:10.1016/0304-3991(91)90193-a
In(1991, November) Ultramicroscopy Vol. 39 (1) Elsevier BV

See Also

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Seeger, Alfred, Phillipp, Fritz (1991) High-voltage electron microscopy in the Federal Republic of Germany: past, present, and future. Ultramicroscopy, 39 (1). 32-44 doi:10.1016/0304-3991(91)90179-a
Seeger, A., Jin, N.Y., Phillipp, F., Zaiser, M. (1991) The study of self-organization processes in crystals by high-voltage electron microscopy. Ultramicroscopy, 39 (1). 342-354 doi:10.1016/0304-3991(91)90214-q
Fujita, Hiroshi (1991) Atom clusters — new applications of high-voltage electron microscopy “micro-laboratory” to materials science. Ultramicroscopy, 39 (1). 369-381 doi:10.1016/0304-3991(91)90217-t
Takeda, Seiji, Hirata, Mitsuji, Muto, Shunsuke, Hua, Guo-Chun, Hiraga, Kenji, Kiritani, Michio (1991) HRTEM observation of electron-irradiation-induced defects penetrating through a thin foil of germanium. Ultramicroscopy, 39 (1). 180-186 doi:10.1016/0304-3991(91)90196-d
Ura, K. (1991) Design concept of a new ultra-high-voltage electron microscope at Osaka University. Ultramicroscopy, 39 (1). 1-7 doi:10.1016/0304-3991(91)90176-7
Matsumura, S., Ohboshi, T., Oki, K., Tomokiyo, Y. (1991) High-voltage electron diffraction study of structure factors of Pd and Pt. Ultramicroscopy, 39 (1). 65-71 doi:10.1016/0304-3991(91)90183-7
Joy, David C. (1991) The theory and practice of high-resolution scanning electron microscopy. Ultramicroscopy, 37 (1). 216-233 doi:10.1016/0304-3991(91)90020-7
Yoshida, Naoaki, Kiritani, Michio, Eiichi Fujita, F. (1975) Electron Radiation Damage of Iron in High Voltage Electron Microscope. Journal of the Physical Society of Japan, 39 (1). 170-179 doi:10.1143/jpsj.39.170
Yoshida, Kiyokazu, Takaoka, Akio, Ura, Katsumi, Katsuta, Teiji, Matsui, Isao (1991) Grooved fluorescent plate for parallel-detection electron energy loss spectroscopy in ultra-high-voltage electron microscopy. Ultramicroscopy, 39 (1). 45-49 doi:10.1016/0304-3991(91)90180-e
Sumida, Naoto, Ikeda, Kazutoyo (1991) Cross-sectional observations of gold-silicon reaction on silicon substrate in situ in the high-voltage electron microscope. Ultramicroscopy, 39 (1). 313-320 doi:10.1016/0304-3991(91)90211-n
Shindo, D., Hiraga, K., Oku, T., Oikawa, T. (1991) Quantification in high-resolution electron microscopy with the imaging plate. Ultramicroscopy, 39 (1). 50-57 doi:10.1016/0304-3991(91)90181-5
 
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