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Wang, Fei, Wang, Yueyu, Zhou, Faquan, Zhao, Xuezeng (2010) Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy. Ultramicroscopy, 110 (6). 592-595 doi:10.1016/j.ultramic.2010.02.016

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Reference TypeJournal (article/letter/editorial)
TitleNovel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy
JournalUltramicroscopy
AuthorsWang, FeiAuthor
Wang, YueyuAuthor
Zhou, FaquanAuthor
Zhao, XuezengAuthor
Year2010 (May)Volume110
Issue6
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.02.016Search in ResearchGate
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Mindat Ref. ID4906128Long-form Identifiermindat:1:5:4906128:0
GUID0
Full ReferenceWang, Fei, Wang, Yueyu, Zhou, Faquan, Zhao, Xuezeng (2010) Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy. Ultramicroscopy, 110 (6). 592-595 doi:10.1016/j.ultramic.2010.02.016
Plain TextWang, Fei, Wang, Yueyu, Zhou, Faquan, Zhao, Xuezeng (2010) Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopy. Ultramicroscopy, 110 (6). 592-595 doi:10.1016/j.ultramic.2010.02.016
In(2010, May) Ultramicroscopy Vol. 110 (6) Elsevier BV

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Fei, W, Yueyu, W, Faquan, Z, Xuezeng, Z (2009) Novel Operation Mode for Eliminating Influence of Inclination Angle and Friction in Atomic Force Microscopy. Microscopy and Microanalysis, 15. 1136-1137 doi:10.1017/s1431927609095816
Cui, Song, Soh, Yeng Chai (2010) A novel probe–sample separation estimation scheme for atomic force microscopy. Ultramicroscopy, 110 (6). 622-625 doi:10.1016/j.ultramic.2010.02.022
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Baumann, Maximilian, Stark, Robert W. (2010) Dual frequency atomic force microscopy on charged surfaces. Ultramicroscopy, 110 (6). 578-581 doi:10.1016/j.ultramic.2010.02.013
Stark, Robert W, Schitter, Georg, Stemmer, Andreas (2004) Velocity dependent friction laws in contact mode atomic force microscopy. Ultramicroscopy, 100 (3). 309-317 doi:10.1016/j.ultramic.2003.11.011
Wang, Fei, Zhao, Xuezeng (2007) Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy. Review of Scientific Instruments, 78 (4). 43701pp. doi:10.1063/1.2720723
Takahashi, Takuji, Ono, Shiano (2005) Sample-and-hold atomic force microscopy for fast operation. Ultramicroscopy, 105 (1). 42-50 doi:10.1016/j.ultramic.2005.06.016
Tetard, L., Passian, A., Farahi, R.H., Kalluri, U.C., Davison, B.H., Thundat, T. (2010) Spectroscopy and atomic force microscopy of biomass. Ultramicroscopy, 110 (6). 701-707 doi:10.1016/j.ultramic.2010.02.035
Li, Ning, Wang, Fei, Zhao, Xuezeng (2010) Effect of tip shape on line edge roughness measurement based on atomic force microscopy. Review of Scientific Instruments, 81 (12). 123703pp. doi:10.1063/1.3518973
Zhou, Fa-Quan, Zhao, Xue-Zeng, Wang, Fei, Wang, Yue-Yu (2010) An Operating Method with Lateral Scan for Reducing the Error in Topography Caused by the Tip-Sample Angle in Atomic Force Microscopy. Microscopy and Microanalysis, 16 (5). 630-635 doi:10.1017/s1431927610093797
Tetard, L., Passian, A., Farahi, R.H., Thundat, T. (2010) Atomic force microscopy of silica nanoparticles and carbon nanohorns in macrophages and red blood cells. Ultramicroscopy, 110 (6). 586-591 doi:10.1016/j.ultramic.2010.02.015
 
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