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Czigány, Zsolt, Hultman, Lars (2010) Interpretation of electron diffraction patterns from amorphous and fullerene-like carbon allotropes. Ultramicroscopy, 110 (7). 815-819 doi:10.1016/j.ultramic.2010.02.005

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Reference TypeJournal (article/letter/editorial)
TitleInterpretation of electron diffraction patterns from amorphous and fullerene-like carbon allotropes
JournalUltramicroscopy
AuthorsCzigány, ZsoltAuthor
Hultman, LarsAuthor
Year2010 (June)Volume110
Issue7
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2010.02.005Search in ResearchGate
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Mindat Ref. ID4906256Long-form Identifiermindat:1:5:4906256:2
GUID0
Full ReferenceCzigány, Zsolt, Hultman, Lars (2010) Interpretation of electron diffraction patterns from amorphous and fullerene-like carbon allotropes. Ultramicroscopy, 110 (7). 815-819 doi:10.1016/j.ultramic.2010.02.005
Plain TextCzigány, Zsolt, Hultman, Lars (2010) Interpretation of electron diffraction patterns from amorphous and fullerene-like carbon allotropes. Ultramicroscopy, 110 (7). 815-819 doi:10.1016/j.ultramic.2010.02.005
In(2010, June) Ultramicroscopy Vol. 110 (7) Elsevier BV

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Tucker, Mark D., Czigány, Zsolt, Broitman, Esteban, Näslund, Lars-Åke, Hultman, Lars, Rosen, Johanna (2014) Filtered pulsed cathodic arc deposition of fullerene-like carbon and carbon nitride films. Journal of Applied Physics, 115 (14). 144312pp. doi:10.1063/1.4871179
Winkelmann, Aimo, Nolze, Gert (2010) Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon. Ultramicroscopy, 110 (3). 190-194 doi:10.1016/j.ultramic.2009.11.008
Eggeman, A.S., White, T.A., Midgley, P.A. (2010) Is precession electron diffraction kinematical? Part II. Ultramicroscopy, 110 (7). 771-777 doi:10.1016/j.ultramic.2009.10.012
White, T.A., Eggeman, A.S., Midgley, P.A. (2010) Is precession electron diffraction kinematical? Part I:. Ultramicroscopy, 110 (7). 763-770 doi:10.1016/j.ultramic.2009.10.013
Czigány, Zs., Neidhardt, J., Brunell, I.F., Hultman, L. (2003) Imaging of fullerene-like structures in CNx thin films by electron microscopy; sample preparation artefacts due to ion-beam milling. Ultramicroscopy, 94 (3). 163-173 doi:10.1016/s0304-3991(02)00261-9
Hultman, Lars, Stafström, Sven, Czigány, Zsolt, Neidhardt, Jörg, Hellgren, Niklas, Brunell, Ian F., Suenaga, Kazu, Colliex, Christian (2001) Cross-Linked Nano-onions of Carbon Nitride in the Solid Phase: Existence of a NovelC48N12Aza-Fullerene. Physical Review Letters, 87 (22). doi:10.1103/physrevlett.87.225503
Li, X.Z. (2010) PCED2.0—A computer program for the simulation of polycrystalline electron diffraction pattern. Ultramicroscopy, 110 (4). 297-304 doi:10.1016/j.ultramic.2009.12.009
Jacob, D., Cordier, P. (2010) A precession electron diffraction study of α, β phases and Dauphiné twin in quartz. Ultramicroscopy, 110 (9). 1166-1177 doi:10.1016/j.ultramic.2010.04.010
Hubert, A.J.M., Römer, R., Beanland, R. (2019) Structure refinement from ‘digital’ large angle convergent beam electron diffraction patterns. Ultramicroscopy, 198. 1-9 doi:10.1016/j.ultramic.2018.12.007
Gueorguiev, G.K., Czigány, Zs., Furlan, A., Stafström, S., Hultman, L. (2011) Intercalation of P atoms in Fullerene-like CPx. Chemical Physics Letters, 501. 400-403 doi:10.1016/j.cplett.2010.11.024
Nakashima, Philip N.H., Moodie, Alexander F., Etheridge, Joanne (2011) A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns. Ultramicroscopy, 111 (7). 841-846 doi:10.1016/j.ultramic.2011.01.044
 
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