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Winkelmann, Aimo, Vos, Maarten (2013) The role of localized recoil in the formation of Kikuchi patterns. Ultramicroscopy, 125. 66-71 doi:10.1016/j.ultramic.2012.11.001

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Reference TypeJournal (article/letter/editorial)
TitleThe role of localized recoil in the formation of Kikuchi patterns
JournalUltramicroscopy
AuthorsWinkelmann, AimoAuthor
Vos, MaartenAuthor
Year2013 (February)Volume125
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2012.11.001Search in ResearchGate
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Mindat Ref. ID4907980Long-form Identifiermindat:1:5:4907980:9
GUID0
Full ReferenceWinkelmann, Aimo, Vos, Maarten (2013) The role of localized recoil in the formation of Kikuchi patterns. Ultramicroscopy, 125. 66-71 doi:10.1016/j.ultramic.2012.11.001
Plain TextWinkelmann, Aimo, Vos, Maarten (2013) The role of localized recoil in the formation of Kikuchi patterns. Ultramicroscopy, 125. 66-71 doi:10.1016/j.ultramic.2012.11.001
In(2013) Ultramicroscopy Vol. 125. Elsevier BV

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Vos, Maarten, Winkelmann, Aimo (2016) Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser. Ultramicroscopy, 171. 19-25 doi:10.1016/j.ultramic.2016.08.015
Vos, M., Winkelmann, A., Nolze, G. (2015) Element-specific Kikuchi patterns of Rutile. Ultramicroscopy, 156. 50-58 doi:10.1016/j.ultramic.2015.04.018
Winkelmann, Aimo, Nolze, Gert (2010) Analysis of Kikuchi band contrast reversal in electron backscatter diffraction patterns of silicon. Ultramicroscopy, 110 (3). 190-194 doi:10.1016/j.ultramic.2009.11.008
Winkelmann, Aimo, Vos, Maarten (2011) Site-Specific Recoil Diffraction of Backscattered Electrons in Crystals. Physical Review Letters, 106 (8). doi:10.1103/physrevlett.106.085503
Went, M.R., Winkelmann, A., Vos, M. (2009) Quantitative measurements of Kikuchi bands in diffraction patterns of backscattered electrons using an electrostatic analyzer. Ultramicroscopy, 109 (10). 1211-1216 doi:10.1016/j.ultramic.2009.05.004
Cios, Grzegorz, Winkelmann, Aimo, Nolze, Gert, Tokarski, Tomasz, Jany, Benedykt R., Bała, Piotr (2024) EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries. Ultramicroscopy, 267. doi:10.1016/j.ultramic.2024.114055
Tokarski, Tomasz, Nolze, Gert, Winkelmann, Aimo, Rychłowski, Łukasz, Bała, Piotr, Cios, Grzegorz (2021) Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio. Ultramicroscopy, 230. 113372pp. doi:10.1016/j.ultramic.2021.113372
Winkelmann, Aimo (2008) Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction. Ultramicroscopy, 108 (12). 1546-1550 doi:10.1016/j.ultramic.2008.05.002
Winkelmann, Aimo, Trager-Cowan, Carol, Sweeney, Francis, Day, Austin P., Parbrook, Peter (2007) Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy, 107 (4). 414-421 doi:10.1016/j.ultramic.2006.10.006
Winkelmann, Aimo, Nolze, Gert (2015) Chirality determination of quartz crystals using Electron Backscatter Diffraction. Ultramicroscopy, 149. 58-63 doi:10.1016/j.ultramic.2014.11.013
Trimby, Patrick, Al-Mosawi, Mohammed, Al-Jawad, Maisoon, Micklethwaite, Stuart, Aslam, Zabeada, Winkelmann, Aimo, Piazolo, Sandra (2024) The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching. Ultramicroscopy, 260. 113940 doi:10.1016/j.ultramic.2024.113940
 
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