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Babinsky, K., De Kloe, R., Clemens, H., Primig, S. (2014) A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. Ultramicroscopy, 144. 9-18 doi:10.1016/j.ultramic.2014.04.003

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Reference TypeJournal (article/letter/editorial)
TitleA novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
JournalUltramicroscopy
AuthorsBabinsky, K.Author
De Kloe, R.Author
Clemens, H.Author
Primig, S.Author
Year2014 (September)Volume144
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2014.04.003Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID4908954Long-form Identifiermindat:1:5:4908954:1
GUID0
Full ReferenceBabinsky, K., De Kloe, R., Clemens, H., Primig, S. (2014) A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. Ultramicroscopy, 144. 9-18 doi:10.1016/j.ultramic.2014.04.003
Plain TextBabinsky, K., De Kloe, R., Clemens, H., Primig, S. (2014) A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. Ultramicroscopy, 144. 9-18 doi:10.1016/j.ultramic.2014.04.003
In(2014) Ultramicroscopy Vol. 144. Elsevier BV

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Thompson, K., Lawrence, D., Larson, D.J., Olson, J.D., Kelly, T.F., Gorman, B. (2007) In situ site-specific specimen preparation for atom probe tomography. Ultramicroscopy, 107 (2). 131-139 doi:10.1016/j.ultramic.2006.06.008
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Miller, M.K., Russell, K.F. (2007) Atom probe specimen preparation with a dual beam SEM/FIB miller. Ultramicroscopy, 107 (9). 761-766 doi:10.1016/j.ultramic.2007.02.023
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