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Konno, Mitsuru, Ogashiwa, Takeshi, Sunaoshi, Takeshi, Orai, Yoshihisa, Sato, Mitsugu (2014) Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope. Ultramicroscopy, 145. 28-35 doi:10.1016/j.ultramic.2013.09.001

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Reference TypeJournal (article/letter/editorial)
TitleLattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope
JournalUltramicroscopy
AuthorsKonno, MitsuruAuthor
Ogashiwa, TakeshiAuthor
Sunaoshi, TakeshiAuthor
Orai, YoshihisaAuthor
Sato, MitsuguAuthor
Year2014 (October)Volume145
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2013.09.001Search in ResearchGate
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Mindat Ref. ID4908979Long-form Identifiermindat:1:5:4908979:0
GUID0
Full ReferenceKonno, Mitsuru, Ogashiwa, Takeshi, Sunaoshi, Takeshi, Orai, Yoshihisa, Sato, Mitsugu (2014) Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope. Ultramicroscopy, 145. 28-35 doi:10.1016/j.ultramic.2013.09.001
Plain TextKonno, Mitsuru, Ogashiwa, Takeshi, Sunaoshi, Takeshi, Orai, Yoshihisa, Sato, Mitsugu (2014) Lattice imaging at an accelerating voltage of 30kV using an in-lens type cold field-emission scanning electron microscope. Ultramicroscopy, 145. 28-35 doi:10.1016/j.ultramic.2013.09.001
In(2014) Ultramicroscopy Vol. 145. Elsevier BV

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Brodusch, Nicolas, Demers, Hendrix, Gellé, Alexandra, Moores, Audrey, Gauvin, Raynald (2019) Electron energy-loss spectroscopy (EELS) with a cold-field emission scanning electron microscope at low accelerating voltage in transmission mode. Ultramicroscopy, 203. 21-36 doi:10.1016/j.ultramic.2018.12.015
Orai, Y, Sunaoshi, T, Okada, S, Ogashiwa, T, Ito, H, Konno, M (2014) Application of Low Energy STEM with the In-lens Cold FE-SEM. Journal of Physics: Conference Series, 522. 12020pp. doi:10.1088/1742-6596/522/1/012020
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