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Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric (2016) Spherical aberration correction with threefold symmetric line currents. Ultramicroscopy, 161. 74-82 doi:10.1016/j.ultramic.2015.11.005

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Reference TypeJournal (article/letter/editorial)
TitleSpherical aberration correction with threefold symmetric line currents
JournalUltramicroscopy
AuthorsHoque, ShahedulAuthor
Ito, HiroyukiAuthor
Nishi, RyujiAuthor
Takaoka, AkioAuthor
Munro, EricAuthor
Year2016 (February)Volume161
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2015.11.005Search in ResearchGate
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Mindat Ref. ID4910068Long-form Identifiermindat:1:5:4910068:6
GUID0
Full ReferenceHoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric (2016) Spherical aberration correction with threefold symmetric line currents. Ultramicroscopy, 161. 74-82 doi:10.1016/j.ultramic.2015.11.005
Plain TextHoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric (2016) Spherical aberration correction with threefold symmetric line currents. Ultramicroscopy, 161. 74-82 doi:10.1016/j.ultramic.2015.11.005
In(2016) Ultramicroscopy Vol. 161. Elsevier BV

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Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji (2018) Spherical aberration correction with an in-lens N-fold symmetric line currents model. Ultramicroscopy, 187. 135-143 doi:10.1016/j.ultramic.2018.02.002
Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) Axial geometrical aberration correction up to 5th order with N-SYLC. Ultramicroscopy, 182. 68-80 doi:10.1016/j.ultramic.2017.06.014
Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) A Novel Method for Higher Order Aberration Correction in Electron Microscopes. Microscopy and Microanalysis, 23. 472-473 doi:10.1017/s143192761700304x
Wang, Fang, Zhang, Hai-Bo, Cao, Meng, Nishi, Ryuji, Takaoka, Akio (2010) Multiple scattering effects of MeV electrons in very thick amorphous specimens. Ultramicroscopy, 110 (3). 259-268 doi:10.1016/j.ultramic.2009.12.013
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Nishi, Ryuji, Yoshida, Kiyokazu, Kanzaki, Hideyuki, Takaoka, Akio (1996) Cross-sectional observation of luminous broadening in YAG scintillator. Ultramicroscopy, 63 (3). 273-278 doi:10.1016/0304-3991(96)00049-6
Urban, K.W., Rose, H. (2016) Reply to L.M. Brown et al. “Brief history of the Cambridge STEM aberration correction project and its progeny” in Ultramicroscopy 157, 88 (2015). Ultramicroscopy, 161. 1-2 doi:10.1016/j.ultramic.2015.11.007
Enyama, Momoyo, Nishi, Ryuji, Ito, Hiroyuki, Yamasaki, Jun (2023) Low-aberration ExB deflector optics for scanning electron microscopy. Microscopy, 72 (5) 399-407 doi:10.1093/jmicro/dfad001
Beck, V.D. (2012) Chicago aberration correction work. Ultramicroscopy, 123. 22-27 doi:10.1016/j.ultramic.2012.06.005
Takaoka, Akio, Hasegawa, Toshiaki, Yoshida, Kiyokazu, Mori, Hirotaro (2008) Microscopic tomography with ultra-HVEM and applications. Ultramicroscopy, 108 (3). 230-238 doi:10.1016/j.ultramic.2007.06.008
Fitzgerald, J.P.S., Word, R.C., Könenkamp, R. (2016) Theoretical estimates of spherical and chromatic aberration in photoemission electron microscopy. Ultramicroscopy, 160. 252-255 doi:10.1016/j.ultramic.2015.10.023
 
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