Watch the Dallas Symposium LIVE, and fundraiser auction
Ticket proceeds support mindat.org! - click here...
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) A Novel Method for Higher Order Aberration Correction in Electron Microscopes. Microscopy and Microanalysis, 23. 472-473 doi:10.1017/s143192761700304x

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleA Novel Method for Higher Order Aberration Correction in Electron Microscopes
JournalMicroscopy and Microanalysis
AuthorsHoque, ShahedulAuthor
Ito, HiroyukiAuthor
Takaoka, AkioAuthor
Nishi, RyujiAuthor
Year2017 (July)Volume23
PublisherCambridge University Press (CUP)
DOIdoi:10.1017/s143192761700304xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID4879911Long-form Identifiermindat:1:5:4879911:9
GUID0
Full ReferenceHoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) A Novel Method for Higher Order Aberration Correction in Electron Microscopes. Microscopy and Microanalysis, 23. 472-473 doi:10.1017/s143192761700304x
Plain TextHoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) A Novel Method for Higher Order Aberration Correction in Electron Microscopes. Microscopy and Microanalysis, 23. 472-473 doi:10.1017/s143192761700304x
In(2017) Microscopy and Microanalysis Vol. 23. Cambridge University Press (CUP)

See Also

These are possibly similar items as determined by title/reference text matching only.

Hoque, Shahedul, Ito, Hiroyuki, Takaoka, Akio, Nishi, Ryuji (2017) Axial geometrical aberration correction up to 5th order with N-SYLC. Ultramicroscopy, 182. 68-80 doi:10.1016/j.ultramic.2017.06.014
Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji, Takaoka, Akio, Munro, Eric (2016) Spherical aberration correction with threefold symmetric line currents. Ultramicroscopy, 161. 74-82 doi:10.1016/j.ultramic.2015.11.005
Hoque, Shahedul, Ito, Hiroyuki, Nishi, Ryuji (2018) Spherical aberration correction with an in-lens N-fold symmetric line currents model. Ultramicroscopy, 187. 135-143 doi:10.1016/j.ultramic.2018.02.002
Enyama, Momoyo, Nishi, Ryuji, Ito, Hiroyuki, Yamasaki, Jun (2023) Low-aberration ExB deflector optics for scanning electron microscopy. Microscopy, 72 (5) 399-407 doi:10.1093/jmicro/dfad001
Khursheed, A., Ang, W. K. (2015) On-Axis Electrode Aberration Correctors for Scanning Electron/Ion Microscopes. Microscopy and Microanalysis, 21. 106-111 doi:10.1017/s1431927615013227
Xin, Huolin L., Muller, David A. (2010) Three-Dimensional Imaging in Aberration-Corrected Electron Microscopes. Microscopy and Microanalysis, 16 (4). 445-455 doi:10.1017/s1431927610093360
Nakashima, Takuya, Suhara, Hiroyuki, Murata, Hidekazu, Shimoyama, Hiroshi (2017) Method for Estimating the Charge Density Distribution on a Dielectric Surface. Microscopy and Microanalysis, 23 (3). 472-483 doi:10.1017/s1431927617000423
Krivanek, Ondrej L. (2021) Aberration correction in electron microscopy and spectroscopy. Microscopy and Microanalysis, 27. 3474-3478 doi:10.1017/s1431927621012435
O'Keefe, Michael A., Allard, Lawrence F. (2004) A Standard for Sub-Ã…ngstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes. Microscopy and Microanalysis, 10. 1002-1003 doi:10.1017/s1431927604880681
Lentzen, Markus (2006) Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction. Microscopy and Microanalysis, 12 (3). 191-205 doi:10.1017/s1431927606060326
Watanabe, M. (2017) Progress in X-ray Mapping in Electron Microscopes Toward Single-Atom Analysis. Microscopy and Microanalysis, 23. 1014-1015 doi:10.1017/s1431927617005736
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: August 24, 2025 02:54:50
Go to top of page