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Tripathi, Abhishek, Zaefferer, Stefan (2019) On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium. Ultramicroscopy, 207. 112828pp. doi:10.1016/j.ultramic.2019.112828

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Reference TypeJournal (article/letter/editorial)
TitleOn the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium
JournalUltramicroscopy
AuthorsTripathi, AbhishekAuthor
Zaefferer, StefanAuthor
Year2019 (December)Volume207
PublisherElsevier BV
DOIdoi:10.1016/j.ultramic.2019.112828Search in ResearchGate
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Mindat Ref. ID4912711Long-form Identifiermindat:1:5:4912711:5
GUID0
Full ReferenceTripathi, Abhishek, Zaefferer, Stefan (2019) On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium. Ultramicroscopy, 207. 112828pp. doi:10.1016/j.ultramic.2019.112828
Plain TextTripathi, Abhishek, Zaefferer, Stefan (2019) On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium. Ultramicroscopy, 207. 112828pp. doi:10.1016/j.ultramic.2019.112828
In(2019) Ultramicroscopy Vol. 207. Elsevier BV

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Steinmetz, D. R., Zaefferer, S. (2010) Towards ultrahigh resolution EBSD by low accelerating voltage. Materials Science and Technology, 26. 640-645 doi:10.1179/026708309x12506933873828
Zaefferer, S. (2007) On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns. Ultramicroscopy, 107 (2). 254-266 doi:10.1016/j.ultramic.2006.08.007
Ruggles, T.J., Fullwood, D.T. (2013) Estimations of bulk geometrically necessary dislocation density using high resolution EBSD. Ultramicroscopy, 133. 8-15 doi:10.1016/j.ultramic.2013.04.011
Maurice, Claire, Driver, Julian H., Fortunier, Roland (2012) On solving the orientation gradient dependency of high angular resolution EBSD. Ultramicroscopy, 113. 171-181 doi:10.1016/j.ultramic.2011.10.013
Shih, Jhih-Wun, Kuo, Ka-Wei, Kuo, Jui-Chao, Kuo, Tsung-Yuan (2017) Effects of accelerating voltage and specimen thickness on the spatial resolution of transmission electron backscatter diffraction in Cu. Ultramicroscopy, 177. 43-52 doi:10.1016/j.ultramic.2017.01.020
Tolstova, Anna P., Dubrovin, Evgeniy V. (2019) Influence of pixelization on height measurement in atomic force microscopy. Ultramicroscopy, 207. 112846pp. doi:10.1016/j.ultramic.2019.112846
Alkorta, Jon (2013) Limits of simulation based high resolution EBSD. Ultramicroscopy, 131. 33-38 doi:10.1016/j.ultramic.2013.03.020
Chen, Delphic, Kuo, Jui-Chao, Wu, Wen-Tuan (2011) Effect of microscopic parameters on EBSD spatial resolution. Ultramicroscopy, 111 (9). 1488-1494 doi:10.1016/j.ultramic.2011.06.007
Grillo, V., Carlino, E. (2006) A novel method for focus assessment in atomic resolution STEM HAADF experiments. Ultramicroscopy, 106 (7). 603-613 doi:10.1016/j.ultramic.2006.03.005
Mecklenburg, Matthew, Hubbard, William A., Lodico, Jared J., Regan, B.C. (2019) Electron beam-induced current imaging with two-angstrom resolution. Ultramicroscopy, 207. 112852pp. doi:10.1016/j.ultramic.2019.112852
van Bremen, R., Ribas Gomes, D., de Jeer, L.T.H., Ocelík, V., De Hosson, J.Th.M. (2016) On the optimum resolution of transmission-electron backscattered diffraction (t-EBSD). Ultramicroscopy, 160. 256-264 doi:10.1016/j.ultramic.2015.10.025
 
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