Reference Type | Journal (article/letter/editorial) |
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Title | Electromigration effects upon the Sn∕Ni–7wt%V interfacial reactions |
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Journal | Journal of Applied Physics |
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Authors | Chen, Chih-chi | Author |
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Chen, Sinn-wen | Author |
Chang, Chih-horng | Author |
Year | 2008 (March 15) | Volume | 103 |
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Issue | 6 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2899956Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5154772 | Long-form Identifier | mindat:1:5:5154772:9 |
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GUID | 0 |
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Full Reference | Chen, Chih-chi, Chen, Sinn-wen, Chang, Chih-horng (2008) Electromigration effects upon the Sn∕Ni–7wt%V interfacial reactions. Journal of Applied Physics, 103 (6). 63518pp. doi:10.1063/1.2899956 |
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Plain Text | Chen, Chih-chi, Chen, Sinn-wen, Chang, Chih-horng (2008) Electromigration effects upon the Sn∕Ni–7wt%V interfacial reactions. Journal of Applied Physics, 103 (6). 63518pp. doi:10.1063/1.2899956 |
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In | (2008, March) Journal of Applied Physics Vol. 103 (6) AIP Publishing |
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