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Do, Young Ho, Kwak, June Sik, Hong, Jin Pyo, Jung, Kyooho, Im, Hyunsik (2008) Al electrode dependent transition to bipolar resistive switching characteristics in pure TiO2 films. Journal of Applied Physics, 104 (11). 114512pp. doi:10.1063/1.3032896

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Reference TypeJournal (article/letter/editorial)
TitleAl electrode dependent transition to bipolar resistive switching characteristics in pure TiO2 films
JournalJournal of Applied Physics
AuthorsDo, Young HoAuthor
Kwak, June SikAuthor
Hong, Jin PyoAuthor
Jung, KyoohoAuthor
Im, HyunsikAuthor
Year2008 (December)Volume104
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.3032896Search in ResearchGate
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Mindat Ref. ID5157966Long-form Identifiermindat:1:5:5157966:7
GUID0
Full ReferenceDo, Young Ho, Kwak, June Sik, Hong, Jin Pyo, Jung, Kyooho, Im, Hyunsik (2008) Al electrode dependent transition to bipolar resistive switching characteristics in pure TiO2 films. Journal of Applied Physics, 104 (11). 114512pp. doi:10.1063/1.3032896
Plain TextDo, Young Ho, Kwak, June Sik, Hong, Jin Pyo, Jung, Kyooho, Im, Hyunsik (2008) Al electrode dependent transition to bipolar resistive switching characteristics in pure TiO2 films. Journal of Applied Physics, 104 (11). 114512pp. doi:10.1063/1.3032896
In(2008, December) Journal of Applied Physics Vol. 104 (11) AIP Publishing

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Do, Young Ho, Kwak, June Sik, Bae, Yoon Cheol, Jung, Kyooho, Im, Hyunsik, Hong, Jin Pyo (2009) Hysteretic bipolar resistive switching characteristics in TiO2/TiO2−x multilayer homojunctions. Applied Physics Letters, 95 (9). 93507pp. doi:10.1063/1.3224179
Kwak, June Sik, Do, Young Ho, Bae, Yoon Cheol, Im, Hyun Sik, Yoo, Jong Hee, Sung, Min Gyu, Hwang, Yun Taek, Hong, Jin Pyo (2010) Roles of interfacial TiOxN1−x layer and TiN electrode on bipolar resistive switching in TiN/TiO2/TiN frameworks. Applied Physics Letters, 96 (22). 223502pp. doi:10.1063/1.3442499
Bae, Yoon Cheol, Lee, Ah Rahm, Kwak, June Sik, Im, Hyunsik, Do, Young Ho, Hong, Jin Pyo (2011) Transition of metallic and insulating Ti sub-oxides in bipolar resistive switching TiO x /TiO y frameworks due to oxygen vacancy drifts. Applied Physics A, 102. 1009-1013 doi:10.1007/s00339-011-6289-0
Hyung Kim, Joo, Rahm Lee, Ah, Cheol Bae, Yoon, Ho Baek, Kwang, Sik Im, Hyun, Pyo Hong, Jin (2014) Observation of bias-dependent noise sources in a TiOx/TiOy bipolar resistive switching frame. Applied Physics Letters, 104 (8). 83508pp. doi:10.1063/1.4865783
Jung, Kyooho, Choi, Joonhyuk, Kim, Yongmin, Im, Hyunsik, Seo, Sunae, Jung, Ranju, Kim, DongChul, Kim, J.-S., Park, B. H., Hong, J. P. (2008) Resistance switching characteristics in Li-doped NiO. Journal of Applied Physics, 103 (3). 34504pp. doi:10.1063/1.2837102
Jung, Kyooho, Kim, Yongmin, Park, Young S, Jung, Woong, Choi, Jungae, Park, Baeho, Kim, Hyungsang, Kim, Wondong, Hong, Jinpyo, Im, Hyunsik (2011) Unipolar resistive switching in insulating niobium oxide film and probing electroforming induced metallic components. Journal of Applied Physics, 109 (5). 54511pp. doi:10.1063/1.3552980
Jung, Kyooho, Kim, Yongmin, Jung, Woong, Im, Hyunsik, Park, Baeho, Hong, Jinpyo, Lee, Jiyeong, Park, Jongku, Lee, Jeon-Kook (2010) Electrically induced conducting nanochannels in an amorphous resistive switching niobium oxide film. Applied Physics Letters, 97 (23). 233509pp. doi:10.1063/1.3525710
Baek, Gwang Ho, Lee, Ah Rahm, Kim, Tae Yoon, Im, Hyun Sik, Hong, Jin Pyo (2016) Oxide stoichiometry-controlled TaOx-based resistive switching behaviors. Applied Physics Letters, 109 (14). 143502pp. doi:10.1063/1.4963884
Lee, Jin-Yong, Kim, Jae-Deuk, Baek, Yoon-Jae, Jin Choi, Young, Jung Kang, Chi, Ho Lee, Hyun, Yoon, Tae-Sik (2014) Voltage-dependent resistive switching characteristics in mixed layer consisting of γ-Fe2O3 and Pt-Fe2O3 core-shell nanoparticles. Applied Physics Letters, 104 (9). 93514pp. doi:10.1063/1.4868015
Rahm Lee, Ah, Cheol Bae, Yoon, Ho Baek, Gwang, Sik Im, Hyun, Pyo Hong, Jin (2013) Multi-level resistive switching observations in asymmetric Pt/Ta2O5−x/TiOxNy/TiN/Ta2O5−x/Pt multilayer configurations. Applied Physics Letters, 103 (6). 63505pp. doi:10.1063/1.4818129
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