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Liu, Yanhong, Gao, Ping, Jiang, Xuening, Li, La, Zhang, Jialiang, Peng, Wei (2014) Percolation mechanism through trapping/de-trapping process at defect states for resistive switching devices with structure of Ag/SixC1βˆ’x/p-Si. Journal of Applied Physics, 116 (6). 64505pp. doi:10.1063/1.4893016

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Reference TypeJournal (article/letter/editorial)
TitlePercolation mechanism through trapping/de-trapping process at defect states for resistive switching devices with structure of Ag/SixC1βˆ’x/p-Si
JournalJournal of Applied Physics
AuthorsLiu, YanhongAuthor
Gao, PingAuthor
Jiang, XueningAuthor
Li, LaAuthor
Zhang, JialiangAuthor
Peng, WeiAuthor
Year2014 (August 14)Volume116
Issue6
PublisherAIP Publishing
DOIdoi:10.1063/1.4893016Search in ResearchGate
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Mindat Ref. ID5200212Long-form Identifiermindat:1:5:5200212:6
GUID0
Full ReferenceLiu, Yanhong, Gao, Ping, Jiang, Xuening, Li, La, Zhang, Jialiang, Peng, Wei (2014) Percolation mechanism through trapping/de-trapping process at defect states for resistive switching devices with structure of Ag/SixC1βˆ’x/p-Si. Journal of Applied Physics, 116 (6). 64505pp. doi:10.1063/1.4893016
Plain TextLiu, Yanhong, Gao, Ping, Jiang, Xuening, Li, La, Zhang, Jialiang, Peng, Wei (2014) Percolation mechanism through trapping/de-trapping process at defect states for resistive switching devices with structure of Ag/SixC1βˆ’x/p-Si. Journal of Applied Physics, 116 (6). 64505pp. doi:10.1063/1.4893016
In(2014, August) Journal of Applied Physics Vol. 116 (6) AIP Publishing

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