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Kang, T. D., Jeon, B. C., Moon, S. J. (2015) Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry. Journal of Applied Physics, 117 (13). 134107pp. doi:10.1063/1.4916722

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Reference TypeJournal (article/letter/editorial)
TitleTemperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry
JournalJournal of Applied Physics
AuthorsKang, T. D.Author
Jeon, B. C.Author
Moon, S. J.Author
Year2015 (April 7)Volume117
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.4916722Search in ResearchGate
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Mindat Ref. ID5200784Long-form Identifiermindat:1:5:5200784:8
GUID0
Full ReferenceKang, T. D., Jeon, B. C., Moon, S. J. (2015) Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry. Journal of Applied Physics, 117 (13). 134107pp. doi:10.1063/1.4916722
Plain TextKang, T. D., Jeon, B. C., Moon, S. J. (2015) Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry. Journal of Applied Physics, 117 (13). 134107pp. doi:10.1063/1.4916722
In(2015, April) Journal of Applied Physics Vol. 117 (13) AIP Publishing

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