Kravchenko, L. Yu., Fil, D. V. (2018) Defect complexes in Ti-doped sapphire: A first principles study. Journal of Applied Physics, 123 (2). 23104pp. doi:10.1063/1.5002532
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Defect complexes in Ti-doped sapphire: A first principles study | ||
Journal | Journal of Applied Physics | ||
Authors | Kravchenko, L. Yu. | Author | |
Fil, D. V. | Author | ||
Year | 2018 (January 14) | Volume | 123 |
Issue | 2 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.5002532Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5209056 | Long-form Identifier | mindat:1:5:5209056:5 |
GUID | 0 | ||
Full Reference | Kravchenko, L. Yu., Fil, D. V. (2018) Defect complexes in Ti-doped sapphire: A first principles study. Journal of Applied Physics, 123 (2). 23104pp. doi:10.1063/1.5002532 | ||
Plain Text | Kravchenko, L. Yu., Fil, D. V. (2018) Defect complexes in Ti-doped sapphire: A first principles study. Journal of Applied Physics, 123 (2). 23104pp. doi:10.1063/1.5002532 | ||
In | (2018, January) Journal of Applied Physics Vol. 123 (2) AIP Publishing |
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