Tawara, T., Matsunaga, S., Fujimoto, T., Ryo, M., Miyazato, M., Miyazawa, T., Takenaka, K., Miyajima, M., Otsuki, A., Yonezawa, Y., Kato, T., Okumura, H., Kimoto, T., Tsuchida, H. (2018) Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes. Journal of Applied Physics, 123 (2). 25707pp. doi:10.1063/1.5009365
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes | ||
| Journal | Journal of Applied Physics | ||
| Authors | Tawara, T. | Author | |
| Matsunaga, S. | Author | ||
| Fujimoto, T. | Author | ||
| Ryo, M. | Author | ||
| Miyazato, M. | Author | ||
| Miyazawa, T. | Author | ||
| Takenaka, K. | Author | ||
| Miyajima, M. | Author | ||
| Otsuki, A. | Author | ||
| Yonezawa, Y. | Author | ||
| Kato, T. | Author | ||
| Okumura, H. | Author | ||
| Kimoto, T. | Author | ||
| Tsuchida, H. | Author | ||
| Year | 2018 (January 14) | Volume | 123 |
| Issue | 2 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.5009365Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5209085 | Long-form Identifier | mindat:1:5:5209085:7 |
| GUID | 0 | ||
| Full Reference | Tawara, T., Matsunaga, S., Fujimoto, T., Ryo, M., Miyazato, M., Miyazawa, T., Takenaka, K., Miyajima, M., Otsuki, A., Yonezawa, Y., Kato, T., Okumura, H., Kimoto, T., Tsuchida, H. (2018) Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes. Journal of Applied Physics, 123 (2). 25707pp. doi:10.1063/1.5009365 | ||
| Plain Text | Tawara, T., Matsunaga, S., Fujimoto, T., Ryo, M., Miyazato, M., Miyazawa, T., Takenaka, K., Miyajima, M., Otsuki, A., Yonezawa, Y., Kato, T., Okumura, H., Kimoto, T., Tsuchida, H. (2018) Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes. Journal of Applied Physics, 123 (2). 25707pp. doi:10.1063/1.5009365 | ||
| In | (2018, January) Journal of Applied Physics Vol. 123 (2) AIP Publishing | ||
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