Kratzer, M., Dimitriev, O. P., Fedoryak, A. N., Osipyonok, N. M., Balaz, P., Balaz, M., Tesinsky, M., Teichert, C. (2019) The role of the probe tip material in distinguishing p- and n-type domains in bulk heterojunction solar cells by atomic force microscopy based methods. Journal of Applied Physics, 125 (18). 185305pp. doi:10.1063/1.5082636

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Reference Type	Journal (article/letter/editorial)
Title	The role of the probe tip material in distinguishing p- and n-type domains in bulk heterojunction solar cells by atomic force microscopy based methods
Journal	Journal of Applied Physics
Authors	Kratzer, M.		Author
	Dimitriev, O. P.		Author
	Fedoryak, A. N.		Author
	Osipyonok, N. M.		Author
	Balaz, P.		Author
	Balaz, M.		Author
	Tesinsky, M.		Author
	Teichert, C.		Author
Year	2019 (May 14)	Volume	125
Issue	18
Publisher	AIP Publishing
DOI	doi:10.1063/1.5082636Search in ResearchGate
	Generate Citation Formats
Mindat Ref. ID	5211033	Long-form Identifier	mindat:1:5:5211033:7
GUID	0
Full Reference	Kratzer, M., Dimitriev, O. P., Fedoryak, A. N., Osipyonok, N. M., Balaz, P., Balaz, M., Tesinsky, M., Teichert, C. (2019) The role of the probe tip material in distinguishing p- and n-type domains in bulk heterojunction solar cells by atomic force microscopy based methods. Journal of Applied Physics, 125 (18). 185305pp. doi:10.1063/1.5082636
Plain Text	Kratzer, M., Dimitriev, O. P., Fedoryak, A. N., Osipyonok, N. M., Balaz, P., Balaz, M., Tesinsky, M., Teichert, C. (2019) The role of the probe tip material in distinguishing p- and n-type domains in bulk heterojunction solar cells by atomic force microscopy based methods. Journal of Applied Physics, 125 (18). 185305pp. doi:10.1063/1.5082636
In	(2019, May) Journal of Applied Physics Vol. 125 (18) AIP Publishing

	Grynko, D O, Fedoryak, O M, Smertenko, P S, Ogurtsov, N A, Pud, A A, Noskov, Yu V, Dimitriev, O P (2013) Application of a CdS nanostructured layer in inverted solar cells. Journal of Physics D: Applied Physics, 46. 495114pp. doi:10.1088/0022-3727/46/49/495114
	Kondratenko, S.V., Lysenko, V.S., Kozyrev, Yu. N., Kratzer, M., Storozhuk, D.P., Iliash, S.A., Czibula, C., Teichert, C. (2016) Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied Surface Science, 389. 783-789 doi:10.1016/j.apsusc.2016.07.148
	Korayem, M. H., Eghbal, M. M., Ebrahimi, N. (2011) Exploring the tip-sample interaction regimes in the presence of hysteretic forces in the tapping mode atomic force microscopy. Journal of Applied Physics, 110 (2). 24512pp. doi:10.1063/1.3610789
	van Cleef, M. W. M., Schropp, R. E. I., Rubinelli, F. A. (1998) Significance of tunneling in p+ amorphous silicon carbide n crystalline silicon heterojunction solar cells. Applied Physics Letters, 73 (18). 2609-2611 doi:10.1063/1.122521
	Kratzer, M., Huszar, M., Tengg, L., Billovits, T., Kaufmann, B., Supancic, P., Clemens, H., Mayer, S., Teichert, C. (2021) Local-probe based electrical characterization of a multiphase intermetallic γ-TiAl based alloy. Journal of Applied Physics, 129 (20) 205107pp. doi:10.1063/5.0048560
	Chen, X., Davies, M. C., Roberts, C. J., Tendler, S. J. B., Williams, P. M. (2000) Hydrodynamic damping of tip oscillation in pulsed-force atomic force microscopy. Applied Physics Letters, 77 (21). 3462-3464 doi:10.1063/1.1325395
	*Coluzza, C., Garozzo, M., Maletta, G., Margadonna, D., Tomaciello, R., Migliorato, P. (1980) n‐CdS/p‐Si heterojunction solar cells. Applied Physics Letters, 37 (6). 569-572 doi:10.1063/1.91787*
	Wetzelaer, G. A. H., Kuik, M., Lenes, M., Blom, P. W. M. (2011) Origin of the dark-current ideality factor in polymer:fullerene bulk heterojunction solar cells. Applied Physics Letters, 99 (15). 153506pp. doi:10.1063/1.3651752
	Lv, Kai, Zhu, H. P., Zou, W. Q., Zhang, F. M., Wu, X. S. (2015) Charge transfer and orbital reconstruction in the (La2/3Sr1/3MnO3)m/(SrRuO3)n superlattices. Journal of Applied Physics, 117 (18). 185305pp. doi:10.1063/1.4921115
	Rahmouni, M., Datta, A., Chatterjee, P., Damon-Lacoste, J., Ballif, C., Roca i Cabarrocas, P. (2010) Carrier transport and sensitivity issues in heterojunction with intrinsic thin layer solar cells on N-type crystalline silicon: A computer simulation study. Journal of Applied Physics, 107 (5). 54521pp. doi:10.1063/1.3326945
	Teichert, C., MacKay, J. F., Savage, D. E., Lagally, M. G., Brohl, M., Wagner, P. (1995) Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft‐x‐ray scattering, and atomic‐force microscopy. Applied Physics Letters, 66 (18). 2346-2348 doi:10.1063/1.113978

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