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Kondratenko, S.V., Lysenko, V.S., Kozyrev, Yu. N., Kratzer, M., Storozhuk, D.P., Iliash, S.A., Czibula, C., Teichert, C. (2016) Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied Surface Science, 389. 783-789 doi:10.1016/j.apsusc.2016.07.148

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Reference TypeJournal (article/letter/editorial)
TitleLocal charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy
JournalApplied Surface Science
AuthorsKondratenko, S.V.Author
Lysenko, V.S.Author
Kozyrev, Yu. N.Author
Kratzer, M.Author
Storozhuk, D.P.Author
Iliash, S.A.Author
Czibula, C.Author
Teichert, C.Author
Year2016 (December)Volume389
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2016.07.148Search in ResearchGate
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Mindat Ref. ID9929178Long-form Identifiermindat:1:5:9929178:9
GUID0
Full ReferenceKondratenko, S.V., Lysenko, V.S., Kozyrev, Yu. N., Kratzer, M., Storozhuk, D.P., Iliash, S.A., Czibula, C., Teichert, C. (2016) Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied Surface Science, 389. 783-789 doi:10.1016/j.apsusc.2016.07.148
Plain TextKondratenko, S.V., Lysenko, V.S., Kozyrev, Yu. N., Kratzer, M., Storozhuk, D.P., Iliash, S.A., Czibula, C., Teichert, C. (2016) Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy. Applied Surface Science, 389. 783-789 doi:10.1016/j.apsusc.2016.07.148
In(n.d.) Applied Surface Science Vol. 389. Elsevier BV

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Kratzer, M., Rubezhanska, M., Prehal, C., Beinik, I., Kondratenko, S. V., Kozyrev, Yu. N., Teichert, C. (2012) Electrical and photovoltaic properties of self-assembled Ge nanodomes on Si(001) Physical Review B, 86 (24) doi:10.1103/physrevb.86.245320
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