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Villarreal, Renan, Kirkham, Christopher J., Scarfato, Alessandro, Bowler, David R., Renner, Christoph (2019) Towards surface diffusion potential mapping on atomic length scale. Journal of Applied Physics, 125 (18). 184301pp. doi:10.1063/1.5091736

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Reference TypeJournal (article/letter/editorial)
TitleTowards surface diffusion potential mapping on atomic length scale
JournalJournal of Applied Physics
AuthorsVillarreal, RenanAuthor
Kirkham, Christopher J.Author
Scarfato, AlessandroAuthor
Bowler, David R.Author
Renner, ChristophAuthor
Year2019 (May 14)Volume125
Issue18
PublisherAIP Publishing
DOIdoi:10.1063/1.5091736Search in ResearchGate
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Mindat Ref. ID5211055Long-form Identifiermindat:1:5:5211055:9
GUID0
Full ReferenceVillarreal, Renan, Kirkham, Christopher J., Scarfato, Alessandro, Bowler, David R., Renner, Christoph (2019) Towards surface diffusion potential mapping on atomic length scale. Journal of Applied Physics, 125 (18). 184301pp. doi:10.1063/1.5091736
Plain TextVillarreal, Renan, Kirkham, Christopher J., Scarfato, Alessandro, Bowler, David R., Renner, Christoph (2019) Towards surface diffusion potential mapping on atomic length scale. Journal of Applied Physics, 125 (18). 184301pp. doi:10.1063/1.5091736
In(2019, May) Journal of Applied Physics Vol. 125 (18) AIP Publishing

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Villarreal, R., Longobardi, M., Köster, S. A., Kirkham, Ch. J., Bowler, D., Renner, Ch. (2015) Structure of Self-Assembled Mn Atom Chains on Si(001). Physical Review Letters, 115 (25). doi:10.1103/physrevlett.115.256104
Pasquier, Vincent, Scarfato, Alessandro, Martinez-Castro, Jose, Guipet, Antoine, Renner, Christoph (2023) Tunable biaxial strain device for low-dimensional materials. Review of Scientific Instruments, 94 (1) 13905 doi:10.1063/5.0100898
Longobardi, M., Kirkham, C. J., Villarreal, R., Köster, S. A., Bowler, D. R., Renner, Ch. (2017) Electronic coupling between Bi nanolines and the Si(001) substrate: An experimental and theoretical study. Physical Review B, 96 (23) doi:10.1103/physrevb.96.235421
Spera, M., Scarfato, A., Pásztor, Á., Giannini, E., Bowler, D. R., Renner, Ch. (2020) Insight into the Charge Density Wave Gap from Contrast Inversion in Topographic STM Images. Physical Review Letters, 125 (26) doi:10.1103/physrevlett.125.267603
Xu, Jie, Chen, Deyuan, Li, Wei, Xu, Jun (2018) Surface potential extraction from electrostatic and Kelvin-probe force microscopy images. Journal of Applied Physics, 123 (18). 184301pp. doi:10.1063/1.5023760
Murata, Koichi, Kirkham, Christopher, Tsubomatsu, Satoshi, Kanazawa, Takashi, Nitta, Kiyofumi, Terada, Yasuko, Uruga, Tomoya, Nittoh, Koh-ichi, Bowler, David R., Miki, Kazushi (2018) Atomic layer doping of Mn magnetic impurities from surface chains at a Ge/Si hetero-interface. Nanoscale, 10. 295-301 doi:10.1039/c7nr07177a
Kirkham, C. J., Brázdová, V., Bowler, D. R. (2012) Bi on the Si(001) surface. Physical Review B, 86 (3) doi:10.1103/physrevb.86.035328
Ramachandran, Rajasree, Biswas, Debabrata (2021) Approximate universality in the tunneling potential for curved field emitters—A line charge model approach. Journal of Applied Physics, 129 (18) 184301pp. doi:10.1063/5.0049050
Pásztor, Árpád, Scarfato, Alessandro, Spera, Marcello, Flicker, Felix, Barreteau, Céline, Giannini, Enrico, Wezel, Jasper van, Renner, Christoph (2021) Multiband charge density wave exposed in a transition metal dichalcogenide. Nature Communications, 12 (1) doi:10.1038/s41467-021-25780-4
Kirkham, C. J., Longobardi, M., Köster, S. A., Renner, Ch., Bowler, D. R. (2017) Subatomic electronic feature from dynamic motion of Si dimer defects in Bi nanolines on Si(001) Physical Review B, 96 (7) doi:10.1103/physrevb.96.075304
Moore, Arnold R. (1983) Theory and experiment on the surface‐photovoltage diffusion‐length measurement as applied to amorphous silicon. Journal of Applied Physics, 54 (1). 222-228 doi:10.1063/1.331745
 
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