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Lakshantha, Wickramaarachchige J., McDaniel, Floyd D., Rout, Bibhudutta (2019) Formation and characterization of embedded Fe3Si binary structures in Si. Journal of Applied Physics, 125 (19). 195301pp. doi:10.1063/1.5091541

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Reference TypeJournal (article/letter/editorial)
TitleFormation and characterization of embedded Fe3Si binary structures in Si
JournalJournal of Applied Physics
AuthorsLakshantha, Wickramaarachchige J.Author
McDaniel, Floyd D.Author
Rout, BibhuduttaAuthor
Year2019 (May 21)Volume125
Issue19
PublisherAIP Publishing
DOIdoi:10.1063/1.5091541Search in ResearchGate
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Mindat Ref. ID5211091Long-form Identifiermindat:1:5:5211091:1
GUID0
Full ReferenceLakshantha, Wickramaarachchige J., McDaniel, Floyd D., Rout, Bibhudutta (2019) Formation and characterization of embedded Fe3Si binary structures in Si. Journal of Applied Physics, 125 (19). 195301pp. doi:10.1063/1.5091541
Plain TextLakshantha, Wickramaarachchige J., McDaniel, Floyd D., Rout, Bibhudutta (2019) Formation and characterization of embedded Fe3Si binary structures in Si. Journal of Applied Physics, 125 (19). 195301pp. doi:10.1063/1.5091541
In(2019, May) Journal of Applied Physics Vol. 125 (19) AIP Publishing

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Sahu, G, Lenka, H P, Mahapatra, D P, Rout, B, McDaniel, F D (2010) Narrow band UV emission from direct bandgap Si nanoclusters embedded in bulk Si. Journal of Physics: Condensed Matter, 22 (7). 72203pp. doi:10.1088/0953-8984/22/7/072203
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