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Chinone, N, Yamasue, K, Honda, K, Cho, Y (2013) High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy. Journal of Physics: Conference Series, 471. 12023pp. doi:10.1088/1742-6596/471/1/012023

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Reference TypeJournal (article/letter/editorial)
TitleHigh resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy
JournalJournal of Physics: Conference Series
AuthorsChinone, NAuthor
Yamasue, KAuthor
Honda, KAuthor
Cho, YAuthor
Year2013 (November 29)Volume471
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/471/1/012023Search in ResearchGate
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Mindat Ref. ID5249780Long-form Identifiermindat:1:5:5249780:1
GUID0
Full ReferenceChinone, N, Yamasue, K, Honda, K, Cho, Y (2013) High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy. Journal of Physics: Conference Series, 471. 12023pp. doi:10.1088/1742-6596/471/1/012023
Plain TextChinone, N, Yamasue, K, Honda, K, Cho, Y (2013) High resolution imaging in cross-section of a metal-oxide-semiconductor field-effect-transistor using super-higher-order nonlinear dielectric microscopy. Journal of Physics: Conference Series, 471. 12023pp. doi:10.1088/1742-6596/471/1/012023
In(2013) Journal of Physics: Conference Series Vol. 471. IOP Publishing

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Chinone, N., Yamasue, K., Hiranaga, Y., Honda, K., Cho, Y. (2012) Lateral resolution improvement in scanning nonlinear dielectric microscopy by measuring super-higher-order nonlinear dielectric constants. Applied Physics Letters, 101 (21). 213112pp. doi:10.1063/1.4766349
Chinone, N., Nakamura, T., Cho, Y. (2014) Cross-sectional dopant profiling and depletion layer visualization of SiC power double diffused metal-oxide-semiconductor field effect transistor using super-higher-order nonlinear dielectric microscopy. Journal of Applied Physics, 116 (8). 84509pp. doi:10.1063/1.4893959
Chinone, Norimichi, Yamasue, Kohei, Hiranaga, Yoshiomi, Cho, Yasuo (2012) Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy. Japanese Journal of Applied Physics, 51. 9 doi:10.1143/jjap.51.09le07
Honda, K, Ishikawa, K, Cho, Y (2010) Observation of dopant profile of transistors using scanning nonlinear dielectric microscopy. Journal of Physics: Conference Series, 209. 12050pp. doi:10.1088/1742-6596/209/1/012050
Chinone, Norimichi, Yamasue, Kohei, Hiranaga, Yoshiomi, Cho, Yasuo (2012) Observation of Nanoscale Ferroelectric Domains Using Super-Higher-Order Nonlinear Dielectric Microscopy. Japanese Journal of Applied Physics, 51 (9) 9 doi:10.7567/jjap.51.09le07
Chinone, N., Cho, Y. (2017) Local deep level transient spectroscopy using super-higher-order scanning nonlinear dielectric microscopy and its application to imaging two-dimensional distribution of SiO2/SiC interface traps. Journal of Applied Physics, 122 (10). 105701pp. doi:10.1063/1.4991739
Karabali, Dimitra (2013) Quantum Hall Effect, Bosonization and Chiral Actions in Higher Dimensions. Journal of Physics: Conference Series, 462. 12023pp. doi:10.1088/1742-6596/462/1/012023
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Omprakash, S S, Naveen Kumar, S K (2020) Solution-Processed Amorphous Zinc Oxide Thin Film Transistor Based NAND Gate. Journal of Physics: Conference Series, 1455. 12023pp. doi:10.1088/1742-6596/1455/1/012023
 
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