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Lee, Wei-Chiang, Hwang, J. (2009) Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential. International Journal of Mass Spectrometry, 279 (2). 76-81 doi:10.1016/j.ijms.2008.10.004

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Reference TypeJournal (article/letter/editorial)
TitlePenning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential
JournalInternational Journal of Mass Spectrometry
AuthorsLee, Wei-ChiangAuthor
Hwang, J.Author
Year2009 (January)Volume279
Issue2
PublisherElsevier BV
DOIdoi:10.1016/j.ijms.2008.10.004Search in ResearchGate
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Mindat Ref. ID5367130Long-form Identifiermindat:1:5:5367130:3
GUID0
Full ReferenceLee, Wei-Chiang, Hwang, J. (2009) Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential. International Journal of Mass Spectrometry, 279 (2). 76-81 doi:10.1016/j.ijms.2008.10.004
Plain TextLee, Wei-Chiang, Hwang, J. (2009) Penning ionization in the electron beam assisted secondary ion mass spectrometry-dependence of ionization potential. International Journal of Mass Spectrometry, 279 (2). 76-81 doi:10.1016/j.ijms.2008.10.004
In(2009, January) International Journal of Mass Spectrometry Vol. 279 (2) Elsevier BV

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