Reference Type | Journal (article/letter/editorial) |
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Title | Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor |
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Journal | Chinese Physics B |
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Authors | You-Run, Zhang | Author |
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Bo, Zhang | Author |
Zhao-Ji, Li | Author |
Xiao-Chuan, Deng | Author |
Year | 2010 (June) | Volume | 19 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1674-1056/19/6/067102Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 6000413 | Long-form Identifier | mindat:1:5:6000413:8 |
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|
GUID | 0 |
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Full Reference | You-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, Deng (2010) Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor. Chinese Physics B, 19. 67102pp. doi:10.1088/1674-1056/19/6/067102 |
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Plain Text | You-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, Deng (2010) Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor. Chinese Physics B, 19. 67102pp. doi:10.1088/1674-1056/19/6/067102 |
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In | (n.d.) Chinese Physics B Vol. 19. IOP Publishing |
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