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You-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, Deng (2010) Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor. Chinese Physics B, 19. 67102pp. doi:10.1088/1674-1056/19/6/067102

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Reference TypeJournal (article/letter/editorial)
TitleTwo-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor
JournalChinese Physics B
AuthorsYou-Run, ZhangAuthor
Bo, ZhangAuthor
Zhao-Ji, LiAuthor
Xiao-Chuan, DengAuthor
Year2010 (June)Volume19
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/19/6/067102Search in ResearchGate
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Mindat Ref. ID6000413Long-form Identifiermindat:1:5:6000413:8
GUID0
Full ReferenceYou-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, Deng (2010) Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor. Chinese Physics B, 19. 67102pp. doi:10.1088/1674-1056/19/6/067102
Plain TextYou-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, Deng (2010) Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor. Chinese Physics B, 19. 67102pp. doi:10.1088/1674-1056/19/6/067102
In(n.d.) Chinese Physics B Vol. 19. IOP Publishing


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