| Reference Type | Journal (article/letter/editorial) |
|---|
| Title | Incident particle range dependence of radiation damage in a power bipolar junction transistor |
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| Journal | Chinese Physics B |
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| Authors | Liu, Chao-Ming | Author |
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| Li, Xing-Ji | Author |
| Geng, Hong-Bin | Author |
| Rui, Er-Ming | Author |
| Guo, Li-Xin | Author |
| Yang, Jian-Qun | Author |
| Year | 2012 (October) | Volume | 21 |
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| Publisher | IOP Publishing |
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| DOI | doi:10.1088/1674-1056/21/10/104211Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 6001920 | Long-form Identifier | mindat:1:5:6001920:0 |
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|
| GUID | 0 |
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| Full Reference | Liu, Chao-Ming, Li, Xing-Ji, Geng, Hong-Bin, Rui, Er-Ming, Guo, Li-Xin, Yang, Jian-Qun (2012) Incident particle range dependence of radiation damage in a power bipolar junction transistor. Chinese Physics B, 21. 104211pp. doi:10.1088/1674-1056/21/10/104211 |
|---|
| Plain Text | Liu, Chao-Ming, Li, Xing-Ji, Geng, Hong-Bin, Rui, Er-Ming, Guo, Li-Xin, Yang, Jian-Qun (2012) Incident particle range dependence of radiation damage in a power bipolar junction transistor. Chinese Physics B, 21. 104211pp. doi:10.1088/1674-1056/21/10/104211 |
|---|
| In | (n.d.) Chinese Physics B Vol. 21. IOP Publishing |
|---|
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