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Liu, Yuan, Chen, Hai-Bo, Liu, Yu-Rong, Wang, Xin, En, Yun-Fei, Li, Bin, Lu, Yu-Dong (2015) Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide. Chinese Physics B, 24. 88503pp. doi:10.1088/1674-1056/24/8/088503

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Reference TypeJournal (article/letter/editorial)
TitleLow frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide
JournalChinese Physics B
AuthorsLiu, YuanAuthor
Chen, Hai-BoAuthor
Liu, Yu-RongAuthor
Wang, XinAuthor
En, Yun-FeiAuthor
Li, BinAuthor
Lu, Yu-DongAuthor
Year2015 (August)Volume24
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/24/8/088503Search in ResearchGate
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Mindat Ref. ID6006517Long-form Identifiermindat:1:5:6006517:5
GUID0
Full ReferenceLiu, Yuan, Chen, Hai-Bo, Liu, Yu-Rong, Wang, Xin, En, Yun-Fei, Li, Bin, Lu, Yu-Dong (2015) Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide. Chinese Physics B, 24. 88503pp. doi:10.1088/1674-1056/24/8/088503
Plain TextLiu, Yuan, Chen, Hai-Bo, Liu, Yu-Rong, Wang, Xin, En, Yun-Fei, Li, Bin, Lu, Yu-Dong (2015) Low frequency noise and radiation response in the partially depleted SOI MOSFETs with ion implanted buried oxide. Chinese Physics B, 24. 88503pp. doi:10.1088/1674-1056/24/8/088503
In(n.d.) Chinese Physics B Vol. 24. IOP Publishing

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