Luo, Jie-Xin, Chen, Jing, Zhou, Jian-Hua, Wu, Qing-Qing, Chai, Zhan, Yu, Tao, Wang, Xi (2012) Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs. Chinese Physics B, 21. 56602pp. doi:10.1088/1674-1056/21/5/056602
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs | ||
| Journal | Chinese Physics B | ||
| Authors | Luo, Jie-Xin | Author | |
| Chen, Jing | Author | ||
| Zhou, Jian-Hua | Author | ||
| Wu, Qing-Qing | Author | ||
| Chai, Zhan | Author | ||
| Yu, Tao | Author | ||
| Wang, Xi | Author | ||
| Year | 2012 (May) | Volume | 21 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/21/5/056602Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6002502 | Long-form Identifier | mindat:1:5:6002502:5 |
| GUID | 0 | ||
| Full Reference | Luo, Jie-Xin, Chen, Jing, Zhou, Jian-Hua, Wu, Qing-Qing, Chai, Zhan, Yu, Tao, Wang, Xi (2012) Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs. Chinese Physics B, 21. 56602pp. doi:10.1088/1674-1056/21/5/056602 | ||
| Plain Text | Luo, Jie-Xin, Chen, Jing, Zhou, Jian-Hua, Wu, Qing-Qing, Chai, Zhan, Yu, Tao, Wang, Xi (2012) Impact of back-gate bias on the hysteresis effect in partially depleted SOI MOSFETs. Chinese Physics B, 21. 56602pp. doi:10.1088/1674-1056/21/5/056602 | ||
| In | (n.d.) Chinese Physics B Vol. 21. IOP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
