Wu, Chen-Fei, Chen, Yun-Feng, Lu, Hai, Huang, Xiao-Ming, Ren, Fang-Fang, Chen, Dun-Jun, Zhang, Rong, Zheng, You-Dou (2016) Contact resistance asymmetry of amorphous indium–gallium–zinc–oxide thin-film transistors by scanning Kelvin probe microscopy. Chinese Physics B, 25. 57306pp. doi:10.1088/1674-1056/25/5/057306
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Contact resistance asymmetry of amorphous indium–gallium–zinc–oxide thin-film transistors by scanning Kelvin probe microscopy | ||
| Journal | Chinese Physics B | ||
| Authors | Wu, Chen-Fei | Author | |
| Chen, Yun-Feng | Author | ||
| Lu, Hai | Author | ||
| Huang, Xiao-Ming | Author | ||
| Ren, Fang-Fang | Author | ||
| Chen, Dun-Jun | Author | ||
| Zhang, Rong | Author | ||
| Zheng, You-Dou | Author | ||
| Year | 2016 (May) | Volume | 25 |
| Publisher | IOP Publishing | ||
| DOI | doi:10.1088/1674-1056/25/5/057306Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 6007320 | Long-form Identifier | mindat:1:5:6007320:8 |
| GUID | 0 | ||
| Full Reference | Wu, Chen-Fei, Chen, Yun-Feng, Lu, Hai, Huang, Xiao-Ming, Ren, Fang-Fang, Chen, Dun-Jun, Zhang, Rong, Zheng, You-Dou (2016) Contact resistance asymmetry of amorphous indium–gallium–zinc–oxide thin-film transistors by scanning Kelvin probe microscopy. Chinese Physics B, 25. 57306pp. doi:10.1088/1674-1056/25/5/057306 | ||
| Plain Text | Wu, Chen-Fei, Chen, Yun-Feng, Lu, Hai, Huang, Xiao-Ming, Ren, Fang-Fang, Chen, Dun-Jun, Zhang, Rong, Zheng, You-Dou (2016) Contact resistance asymmetry of amorphous indium–gallium–zinc–oxide thin-film transistors by scanning Kelvin probe microscopy. Chinese Physics B, 25. 57306pp. doi:10.1088/1674-1056/25/5/057306 | ||
| In | (n.d.) Chinese Physics B Vol. 25. IOP Publishing | ||
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