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Tolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L. (2000) Neutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry. Surface Science, 466 (1). 127-136 doi:10.1016/s0039-6028(00)00744-5

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Reference TypeJournal (article/letter/editorial)
TitleNeutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry
JournalSurface Science
AuthorsTolstogouzov, A.Author
Daolio, S.Author
Pagura, C.Author
Greenwood, C.L.Author
Year2000 (November)Volume466
Issue1
PublisherElsevier BV
DOIdoi:10.1016/s0039-6028(00)00744-5Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID6475140Long-form Identifiermindat:1:5:6475140:1
GUID0
Full ReferenceTolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L. (2000) Neutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry. Surface Science, 466 (1). 127-136 doi:10.1016/s0039-6028(00)00744-5
Plain TextTolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L. (2000) Neutralization of low-energy Ne+ ions scattered from metal surfaces: study by mass-resolved ion-scattering spectrometry. Surface Science, 466 (1). 127-136 doi:10.1016/s0039-6028(00)00744-5
In(2000, November) Surface Science Vol. 466 (1) Elsevier BV

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Tolstogouzov, A., Daolio, S., Pagura, C. (1999) Evaluation of inelastic energy losses for low-energy Ne+ ions scattered from aluminum and silicon surfaces. Surface Science, 441 (1). 213-222 doi:10.1016/s0039-6028(99)00881-x
Tolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L. (2003) Dependence of scattered ion yield on the incident energy: Ne+ on pure gallium and indium. Surface Science, 531 (2). 95-102 doi:10.1016/s0039-6028(03)00532-6
Tolstogouzov, A, Daolio, S, Pagura, C, Greenwood, C.L (2002) Energy distributions of secondary ions sputtered from aluminium and magnesium by Ne+, Ar+ and O2+: a comprehensive study. International Journal of Mass Spectrometry, 214 (3). 327-337 doi:10.1016/s1387-3806(02)00523-7
Daolio, S, Pagura, C, Tolstogouzov, A (2004) Mass-resolved ion scattering spectrometry for characterization of samples with historical value. Applied Surface Science, 222. 166-170 doi:10.1016/j.apsusc.2003.08.005
Tolstogouzov, A., Daolio, S., Pagura, C. (2001) Hyperthermal and low-energy Ne+ scattering from Au and Pt surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 183 (1). 116-127 doi:10.1016/s0168-583x(01)00521-3
Tolstogouzov, A, Daolio, S, Pagura, C (2004) MARISS study on ion yields of Ne+ scattered from III–V compound semiconductors. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 217 (2). 246-252 doi:10.1016/j.nimb.2003.11.005
Tolstogouzov, A., Daolio, S., Pagura, C., Greenwood, C.L., Karpuzov, D.S., McIntyre, N.S. (2003) Energy distributions of Ga+ and In+ secondary ions sputtered from AIIIBV compound semiconductors by noble gas ions: Mass-dependence of the high-energy yield on the second component (P, As, Sb) of the compounds. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 203. 198-204 doi:10.1016/s0168-583x(02)02217-6
Daolio, S., Facchin, B., Pagura, C., Tolstogouzov, A., Konenkov, N. (1999) Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions. Rapid Communications in Mass Spectrometry, 13 (9). 782-785 doi:10.1002/(sici)1097-0231(19990515)13:9<782::aid-rcm564>3.0.co;2-l
Daolio, S., Facchin, B., Pagura, C., De Battisti, A., Battaglin, G. (1990) Mixed-Oxide electrode study by secondary ion mass spectrometry. Surface and Interface Analysis, 16 (1). 457-460 doi:10.1002/sia.740160194
Daolio, S., Facchin, B., Pagura, C., Guerriero, P., Sitran, S., Vigato, P.A. (1990) Secondary ion mass spectrometry in the study of lanthanide compounds. Inorganica Chimica Acta, 178 (1). 131-137 doi:10.1016/s0020-1693(00)88145-1
Almulhem, Abdalaziz A (1994) Resonance tunneling neutralization of low-energy ions near metal surfaces. Surface Science, 304 (1). 191-200 doi:10.1016/0039-6028(94)90764-1
 
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