Daolio, S, Pagura, C, Tolstogouzov, A (2004) Mass-resolved ion scattering spectrometry for characterization of samples with historical value. Applied Surface Science, 222. 166-170 doi:10.1016/j.apsusc.2003.08.005
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Mass-resolved ion scattering spectrometry for characterization of samples with historical value | ||
Journal | Applied Surface Science | ||
Authors | Daolio, S | Author | |
Pagura, C | Author | ||
Tolstogouzov, A | Author | ||
Year | 2004 (January) | Volume | 222 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.apsusc.2003.08.005Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9905623 | Long-form Identifier | mindat:1:5:9905623:8 |
GUID | 0 | ||
Full Reference | Daolio, S, Pagura, C, Tolstogouzov, A (2004) Mass-resolved ion scattering spectrometry for characterization of samples with historical value. Applied Surface Science, 222. 166-170 doi:10.1016/j.apsusc.2003.08.005 | ||
Plain Text | Daolio, S, Pagura, C, Tolstogouzov, A (2004) Mass-resolved ion scattering spectrometry for characterization of samples with historical value. Applied Surface Science, 222. 166-170 doi:10.1016/j.apsusc.2003.08.005 | ||
In | (n.d.) Applied Surface Science Vol. 222. Elsevier BV |
See Also
These are possibly similar items as determined by title/reference text matching only.