Hayashi, Kouichi, Takahashi, Yukio, Matsubara, Ei-ichiro (2002) Refinement of X-ray Fluorescence Holography for Determination of Local Atomic Environment. MATERIALS TRANSACTIONS, 43 (7). 1464-1468 doi:10.2320/matertrans.43.1464
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Refinement of X-ray Fluorescence Holography for Determination of Local Atomic Environment | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Hayashi, Kouichi | Author | |
Takahashi, Yukio | Author | ||
Matsubara, Ei-ichiro | Author | ||
Year | 2002 | Volume | 43 |
Issue | 7 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.43.1464Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7776551 | Long-form Identifier | mindat:1:5:7776551:0 |
GUID | 0 | ||
Full Reference | Hayashi, Kouichi, Takahashi, Yukio, Matsubara, Ei-ichiro (2002) Refinement of X-ray Fluorescence Holography for Determination of Local Atomic Environment. MATERIALS TRANSACTIONS, 43 (7). 1464-1468 doi:10.2320/matertrans.43.1464 | ||
Plain Text | Hayashi, Kouichi, Takahashi, Yukio, Matsubara, Ei-ichiro (2002) Refinement of X-ray Fluorescence Holography for Determination of Local Atomic Environment. MATERIALS TRANSACTIONS, 43 (7). 1464-1468 doi:10.2320/matertrans.43.1464 | ||
In | (2002) MATERIALS TRANSACTIONS Vol. 43 (7) Japan Institute of Metals |
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