Hayashi, Kouichi, Takahashi, Yukio, Yonenaga, Ichiro, Matsubara, Eiichiro (2004) X-ray Fluorescence Holography Study on Si1−xGex Single Crystal. MATERIALS TRANSACTIONS, 45 (7). 1994-1997 doi:10.2320/matertrans.45.1994
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | X-ray Fluorescence Holography Study on Si1−xGex Single Crystal | ||
Journal | MATERIALS TRANSACTIONS | ||
Authors | Hayashi, Kouichi | Author | |
Takahashi, Yukio | Author | ||
Yonenaga, Ichiro | Author | ||
Matsubara, Eiichiro | Author | ||
Year | 2004 | Volume | 45 |
Issue | 7 | ||
Publisher | Japan Institute of Metals | ||
DOI | doi:10.2320/matertrans.45.1994Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 7777602 | Long-form Identifier | mindat:1:5:7777602:0 |
GUID | 0 | ||
Full Reference | Hayashi, Kouichi, Takahashi, Yukio, Yonenaga, Ichiro, Matsubara, Eiichiro (2004) X-ray Fluorescence Holography Study on Si1−xGex Single Crystal. MATERIALS TRANSACTIONS, 45 (7). 1994-1997 doi:10.2320/matertrans.45.1994 | ||
Plain Text | Hayashi, Kouichi, Takahashi, Yukio, Yonenaga, Ichiro, Matsubara, Eiichiro (2004) X-ray Fluorescence Holography Study on Si1−xGex Single Crystal. MATERIALS TRANSACTIONS, 45 (7). 1994-1997 doi:10.2320/matertrans.45.1994 | ||
In | (2004) MATERIALS TRANSACTIONS Vol. 45 (7) Japan Institute of Metals |
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