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Martin, Yves, Abraham, David W., Wickramasinghe, H. Kumar (1988) High‐resolution capacitance measurement and potentiometry by force microscopy. Applied Physics Letters, 52 (13). 1103-1105 doi:10.1063/1.99224

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Reference TypeJournal (article/letter/editorial)
TitleHigh‐resolution capacitance measurement and potentiometry by force microscopy
JournalApplied Physics Letters
AuthorsMartin, YvesAuthor
Abraham, David W.Author
Wickramasinghe, H. KumarAuthor
Year1988 (March 28)Volume52
Issue13
PublisherAIP Publishing
DOIdoi:10.1063/1.99224Search in ResearchGate
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Mindat Ref. ID8482647Long-form Identifiermindat:1:5:8482647:5
GUID0
Full ReferenceMartin, Yves, Abraham, David W., Wickramasinghe, H. Kumar (1988) High‐resolution capacitance measurement and potentiometry by force microscopy. Applied Physics Letters, 52 (13). 1103-1105 doi:10.1063/1.99224
Plain TextMartin, Yves, Abraham, David W., Wickramasinghe, H. Kumar (1988) High‐resolution capacitance measurement and potentiometry by force microscopy. Applied Physics Letters, 52 (13). 1103-1105 doi:10.1063/1.99224
In(1988, March) Applied Physics Letters Vol. 52 (13) AIP Publishing

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Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Measurement of in‐plane magnetization by force microscopy. Applied Physics Letters, 53 (15). 1446-1448 doi:10.1063/1.99964
Martin, Y., Rugar, D., Wickramasinghe, H. K. (1988) High‐resolution magnetic imaging of domains in TbFe by force microscopy. Applied Physics Letters, 52 (3). 244-246 doi:10.1063/1.99482
Martin, Yves, Wickramasinghe, H. Kumar (1994) Method for imaging sidewalls by atomic force microscopy. Applied Physics Letters, 64 (19). 2498-2500 doi:10.1063/1.111578
Wickramasinghe, H. K., Martin, Y. (1988) High‐resolution magnetic imaging by force microscopy (invited) (abstract). Journal of Applied Physics, 63 (8). 2948 doi:10.1063/1.340911
Hobbs, Philip C. D., Abraham, David W., Wickramasinghe, H. K. (1989) Magnetic force microscopy with 25 nm resolution. Applied Physics Letters, 55 (22). 2357-2359 doi:10.1063/1.102017
Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) High-resolution force microscopy of in-plane magnetization. Journal of Microscopy, 152 (3). 863-869 doi:10.1111/j.1365-2818.1988.tb01459.x
Martin, Y., Wickramasinghe, H. K. (1987) Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution. Applied Physics Letters, 50 (20). 1455-1457 doi:10.1063/1.97800
Martin, Yves C., Wickramasinghe, H. Kumar (2002) Resolution test for apertureless near-field optical microscopy. Journal of Applied Physics, 91 (5). 3363-3368 doi:10.1063/1.1431430
Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Noise reduction technique for scanning tunneling microscopy. Applied Physics Letters, 53 (16). 1503-1505 doi:10.1063/1.99940
Williams, C. C., Slinkman, J., Hough, W. P., Wickramasinghe, H. K. (1989) Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy. Applied Physics Letters, 55 (16). 1662-1664 doi:10.1063/1.102312
Unal, Kerem, Frommer, Jane, Kumar Wickramasinghe, H. (2006) Ultrafast molecule sorting and delivery by atomic force microscopy. Applied Physics Letters, 88 (18). 183105pp. doi:10.1063/1.2195777
 
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