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Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Measurement of in‐plane magnetization by force microscopy. Applied Physics Letters, 53 (15). 1446-1448 doi:10.1063/1.99964

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Reference TypeJournal (article/letter/editorial)
TitleMeasurement of in‐plane magnetization by force microscopy
JournalApplied Physics Letters
AuthorsAbraham, David W.Author
Williams, C. C.Author
Wickramasinghe, H. K.Author
Year1988 (October 10)Volume53
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.99964Search in ResearchGate
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Mindat Ref. ID8484403Long-form Identifiermindat:1:5:8484403:7
GUID0
Full ReferenceAbraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Measurement of in‐plane magnetization by force microscopy. Applied Physics Letters, 53 (15). 1446-1448 doi:10.1063/1.99964
Plain TextAbraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Measurement of in‐plane magnetization by force microscopy. Applied Physics Letters, 53 (15). 1446-1448 doi:10.1063/1.99964
In(1988, October) Applied Physics Letters Vol. 53 (15) AIP Publishing

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Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) High-resolution force microscopy of in-plane magnetization. Journal of Microscopy, 152 (3). 863-869 doi:10.1111/j.1365-2818.1988.tb01459.x
Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Noise reduction technique for scanning tunneling microscopy. Applied Physics Letters, 53 (16). 1503-1505 doi:10.1063/1.99940
Martin, Yves, Abraham, David W., Wickramasinghe, H. Kumar (1988) High‐resolution capacitance measurement and potentiometry by force microscopy. Applied Physics Letters, 52 (13). 1103-1105 doi:10.1063/1.99224
Hobbs, Philip C. D., Abraham, David W., Wickramasinghe, H. K. (1989) Magnetic force microscopy with 25 nm resolution. Applied Physics Letters, 55 (22). 2357-2359 doi:10.1063/1.102017
Abraham, David W., Williams, C. C., Wickramasinghe, H. K. (1988) Differential scanning tunnelling microscopy. Journal of Microscopy, 152 (3). 599-604 doi:10.1111/j.1365-2818.1988.tb01426.x
Williams, C. C., Slinkman, J., Hough, W. P., Wickramasinghe, H. K. (1989) Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy. Applied Physics Letters, 55 (16). 1662-1664 doi:10.1063/1.102312
Martin, Y., Rugar, D., Wickramasinghe, H. K. (1988) High‐resolution magnetic imaging of domains in TbFe by force microscopy. Applied Physics Letters, 52 (3). 244-246 doi:10.1063/1.99482
Sáenz, J. J., García, N., Slonczewski, J. C. (1988) Theory of magnetic imaging by force microscopy. Applied Physics Letters, 53 (15). 1449-1451 doi:10.1063/1.99965
Wickramasinghe, H. K., Martin, Y. (1988) High‐resolution magnetic imaging by force microscopy (invited) (abstract). Journal of Applied Physics, 63 (8). 2948 doi:10.1063/1.340911
Williams, C. C., Wickramasinghe, H. K. (1986) Scanning thermal profiler. Applied Physics Letters, 49 (23). 1587-1589 doi:10.1063/1.97288
Nawarathna, D., Unal, K., Wickramasinghe, H. Kumar (2008) Localized electroporation and molecular delivery into single living cells by atomic force microscopy. Applied Physics Letters, 93 (15). 153111pp. doi:10.1063/1.2981568
 
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